4 f(P1) giant dipole resonance in La³⁺

Photoabsorption of free La3+ ions in the 4d excitation region has been measured using the dual-laser plasma technique. A dramatic strong and broad 4d94f(1P) giant dipole resonance was observed. The interpretation of the results is provided using theoretical techniques which go beyond the independent particle approximation. In particular the strong term dependence for 4f(1P) gives evidence of strong polarization effects for the description of the giant dipole resonance

SINGLE AND DOUBLE. PHOTOIONIZATION OF LANTHANIDE ELEMENTS IN THE REGION OF THE 5p EXCITATION

Monochromatized synchrotron radiation, atomic beam technique and a TOF spectrometer were used to measure the cross section of single and double photoionization of the lanthanide elements in the region of the 5p excitation. A systematic difference between light and heavy elements was observed

Evaluation of ion projection using heavy ions suitable for resistless patterning of thin magnetic films

The ion projector at the Fraunhofer Institute ISiT has been used for the development of patterned magnetic media for potential future use in magnetic hard disk drives. By 8.8 times demagnification of an open stencil mask, magnetic contrast is generated by ion intermixing of Co/Pt sandwich layers. In this application a resist process is not necessary and the surface roughness of magnetic media is not altered. Monte Carlo simulations of the intermixing process with the dynamic T-Dyn software for H, He, Ne, Ar and Au ions show that the exposure dose can be reduced by a factor of 100 by irradiation with Ar+ ions instead of He+. This has been confirmed by magnetic force microscopy of 200 nm magnetic dots irradiated at a dose of 6×1013 Ar+/cm2 at 73 keV energy. Sufficient stability of the ion optical system concerning resolution and drift has been demonstrated by exposures in developed and undeveloped (latent image) resist down to 60 nm dots

Optimierte Integration fuer Hochfrequenzsysteme Abschlussbericht

Available from TIB Hannover: F00B1163 / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekSIGLEBundesministerium fuer Bildung, Wissenschaft, Forschung und Technologie, Bonn (Germany)DEGerman