Photovoltages in Polycrystalline Mosaic Solar Cells

In some thin-film solar cells the light-absorbing layer is a mosaic of crystalline grains whose boundaries run from the back to the front of the cell. We used the semiconductor modeling software Sesame to do numerical calculations of the optoelectronic properties of such cells assuming that recombination of minority photocarriers occurs primarily at the grain boundaries. The work complements analytical results for diffusion-limited recombination at grain boundaries and dislocations. We chose idealized n-CdS/p-CdTe solar cells for illustration. We find that the open-circuit voltage, Voc, under illumination declines logarithmically with increasing ratio D/θ2, where D is the ambipolar diffusion constant governing minority-carrier transport and θ is the grain size (from 1 to 10 μm). While a decline in VOC as mobility increases is counterintuitive, this finding is consistent with related analytical results and confirms their utility. However, open-circuit voltages are about 0.04−0.10 V lower than the corresponding analytical estimates. We show that the deficit is mostly a consequence of a recombination shortcut. At open circuit, minority photocarrier currents at points closer to the n-CdS interface than to a grain boundary are directed through the conducting front layers and terminate near the “hot spot” at the intersection with the grain boundary. The shortcut lowers open-circuit voltages by about 0.05 V below the analytical estimates

Hole Drift Mobility Measurements on a-Si:H using Surface and Uniformly Absorbed Illumination

The standard, time-of-flight method for measuring drift mobilities in semiconductors uses strongly absorbed illumination to create a sheet of photocarriers near an electrode interface. This method is problematic for solar cells deposited onto opaque substrates, and in particular cannot be used for hole photocarriers in hydrogenated amorphous silicon (a-Si:H) solar cells using stainless steel substrates. In this paper we report on the extension of the time-of-flight method that uses weakly absorbed illumination. We measured hole drift-mobilities on seven a-Si:H nip solar cells using strongly and weakly absorbed illumination incident through the n-layer. For thinner devices from two laboratories, the drift-mobilities agreed with each other to within a random error of about 15%. For thicker devices from United Solar, the driftmobilities were about twice as large when measured using strongly absorbed illumination. We propose that this effect is due to a mobility profile in the intrinsic absorber layer in which the mobility decreases for increasing distance from the substrate

Electron and hole drift mobility measurements on thin film CdTe solar cells

We report electron and hole drift mobilities in thin film polycrystalline CdTe solar cells based on photocarrier time-of-flight measurements. For a deposition process similar to that used for high-efficiency cells, the electron drift mobilities are in the range of 10–100 cm2/Vs, and holes are in the range of 1–10 cm2/Vs. The electron drift mobilities are about a thousand times smaller than those measured in single crystal CdTe with time-of-flight; the hole mobilities are about ten times smaller. Cells were examined before and after a vapor phase treatment with CdCl2; treatment had little effect on the hole drift mobility, but decreased the electron mobility. We are able to exclude bandtail trapping and dispersion as a mechanism for the small drift mobilities in thin film CdTe, but the actual mechanism reducing the mobilities from the single crystal values is not known

Electron drift-mobility measurements in polycrystalline CuIn1-xGaxSe2 solar cells

We report photocarrier time-of-flight measurements of electron drift mobilities for the p-type CuIn1-xGaxSe2 films incorporated in solar cells. The electron mobilities range from 0.02 to 0.05 cm^2/Vs and are weakly temperature-dependent from 100–300 K. These values are lower than the range of electron Hall mobilities (2-1100 cm2/Vs) reported for n-type polycrystalline thin films and single crystals. We propose that the electron drift mobilities are properties of disorder-induced mobility edges and discuss how this disorder could increase cell efficiencies