10 research outputs found

    Distributed approach for parallel exact critical path tracing fault simulation

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    Distributed computing attempts to aggregate different computing resources available in enterprises and in the Internet for computation intensive applications in a transparent and scalable way. Fault simulation used in digital design flow for test quality evaluation can require a lot of processor and memory resources. To speed up simulation and to overcome the problem of memory limits in the case of very large circuits, a method of model partitioning and the procedure of parallel reasoning for several distributed simulation agents was proposed. The concept and implementation of web-based distributed system was introduced

    In-system programming of non-volatile memories on microprocessor-centric boards

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    With the continuous growth of capacity of non-volatile memories (NVM) in-system programming (ISP) has become the most time-consuming step in post-assembly phase of board manufacturing. This paper presents a method to assess ISP solutions for on-chip and on-board NVMs. The major contribution of the approach is the formal basis for evaluation of the state-of-the-art ISP solutions. The proposed comparison pin-points the time losses, that can be eliminated by the use of multiple page buffers. The technique has proven to achieve exceptionally short programming time, which is close to the operational speed limit of modern NVMs. The method is based on the ubiquitous JTAG access bus which makes it applicable for the most board manufacturing strategies despite a slow nature of JTAG bus

    On In-System Programming of Non-volatile Memories

    No full text
    With the continuous growth of capacity of non-volatile memories (NVM) in-system programming (ISP) has become the most time-consuming step in post-assembly phase of board manufacturing. This paper presents a method to assess ISP solutions for on-chip and on-board NVMs. The major contribution of the approach is the formal basis for comparison of state-of-the-art ISP solutions. The effective comparison pin-points the time losses, that can be eliminated by the use of multiple page buffers. The technique has proven to achieve exceptionally short programming time, which is close to the operational speed limit of modern NVMs. The method is based on the ubiquitous JTAG access bus which makes it applicable for the most board manufacturing strategies despite a slow nature of JTAG bus

    Open-Source JTAG Simulator Bundle for Labs

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    This paper presents a software/hardware bundle for studying, training and research related to IEEE 1149.1 Boundary Scan (BS) standard. The presented package includes a software environment Trainer 1149 that is capable to graphically visualize BS facilities and perform fine-grain simulation of BS test process. Trainer 1149 provides a cozy graphical design and simulation environment of BS-enabled chips and non-BS clusters. It provides the user with a full flexibility in working with any type of BS structures by supporting standard formats such as Boundary Scan Description Language and SVF (for defining test patterns). A special fault simulation mode allows injecting various types of interconnection faults to simulate their impact and inspect them using interactive tools. Trainer 1149 is the main component of a recent goJTAG initiative that aims at bringing JTAG tools closer to the user for both learning and experimental work purposes. The software part is implemented in multi-platform Java environment and distributed as an open-source freeware. Using a convenient low-cost USB-JTAG controller, one can also test real defects in real hardware. Such combination of features is unique for a public domain BS package

    Open-Source JTAG Simulator Bundle for Labs

    No full text
    This paper presents a software/hardware bundle for studying, training and research related to IEEE 1149.1 Boundary Scan (BS) standard. The presented package includes a software environment Trainer 1149 that is capable to graphically visualize BS facilities and perform fine-grain simulation of BS test process. Trainer 1149 provides a cozy graphical design and simulation environment of BS-enabled chips and non-BS clusters. It provides the user with a full flexibility in working with any type of BS structures by supporting standard formats such as Boundary Scan Description Language and SVF (for defining test patterns). A special fault simulation mode allows injecting various types of interconnection faults to simulate their impact and inspect them using interactive tools. Trainer 1149 is the main component of a recent goJTAG initiative that aims at bringing JTAG tools closer to the user for both learning and experimental work purposes. The software part is implemented in multi-platform Java environment and distributed as an open-source freeware. Using a convenient low-cost USB-JTAG controller, one can also test real defects in real hardware. Such combination of features is unique for a public domain BS package
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