Spinrauschen in nulldimensionalen Strukturen

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Optical Spin Noise of a Single Hole Spin Localized in an (InGa)As Quantum Dot

We advance spin noise spectroscopy to the ultimate limit of single spin detection. This technique enables the measurement of the spin dynamic of a single heavy hole localized in a flat (InGa)As quantum dot. Magnetic field and light intensity dependent studies reveal even at low magnetic fields a strong magnetic field dependence of the longitudinal heavy hole spin relaxation time with an extremely long $T_1$ of $\ge$ 180 $\mu$s at 31 mT and 5 K. The wavelength dependence of the spin noise power discloses for finite light intensities an inhomogeneous single quantum dot spin noise spectrum which is explained by charge fluctuations in the direct neighborhood of the quantum dot. The charge fluctuations are corroborated by the distinct intensity dependence of the effective spin relaxation rate

The rise of spin noise spectroscopy in semiconductors: From acoustic to GHz frequencies

This article gives an overview on the advance of spin noise spectroscopy (SNS) in semiconductors in the past 8 years from the first measurements in bulk n-GaAs [Oestreich et al., Phys. Rev. Lett. 95, 216603 (2005)] up to the recent achievement of optical detection of the intrinsic spin fluctuations of a single hole confined in an individual self-assembled quantum dot [Dahbashi et al., arXiv:1306.3183 (2013)]. We discuss the general technical implementation of optical SNS and the invaluable profit of the introduction of real-time fast Fourier transform analysis into the data acquisition. By now, the full spin dynamic from the milli- to picosecond timescales can be addressed by SNS and the technique quickly strides ahead to enable real quantum non-demolition measurements in semiconductors. Spin noise spectra recorded in 2005 in bulk n-GaAs with approximately 109 electron spins (Oestreich et al.) and 2013 (Dahbashi et al.) for a single hole spin. The integration time for the latter is more than a factor of 40 shorter due to the significant advances in the measurement technique