8 research outputs found
Real time monitoring of laser beam welding keyhole depth by laser interferometry
- Author
- Publication venue
- 'Maney Publishing'
- Publication date
- Field of study
Numerical modeling on the formation process of keyhole-induced porosity for laser welding steel with T-joint
- Author
- A Kaplan
- A Matsunawa
- A Matsunawa
- BJ Aalderinka
- CW Hirt
- DF Farson
- DF Farson
- DV Bedenko
- F Roland
- Fenggui Lu
- G Liang
- H Ki
- H Pantsar
- H Zhao
- Haichao Cui
- J Romanoff
- J Yang
- J Zhou
- J Zhou
- J Zhou
- JH Cho
- K Kazemi
- PG Sanders
- R Rai
- S Beretta
- S Fujinaga
- S Pang
- V Semak
- V Voller
- VV Semak
- W-I Cho
- W-I Cho
- X Jin
- X Jin
- X Jin
- XH Ye
- Xibin Li
- Xinhua Tang
- Y Kawahito
- Yixiong Wu
- Z Gao
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- Field of study
Wavelet analysis-based expulsion identification in electrode force sensing of resistance spot welding
- Author
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- Field of study
Laser welding defects detection in automotive industry based on radiation and spectroscopical measurements
- Author
- A Ancona
- A Poueyo-Verwaerde
- C Alipi
- DF Farson
- DF Marson
- EY Zhang
- F Gustafsson
- Fernando Rodríguez
- FM Haran
- G Hongping
- H Park
- H Park
- HR Griem
- J Mirapeix
- José M. Bernárdez
- José R. Perán
- Luis J. Miguel
- M Basseville
- P Norman
- Roberto Arnanz Gómez
- S Haykin
- Sergio Saludes Rodil
- T Klein
- T Klein
- T Sibillano
- T Sibillano
- T Sibillano
- Z Szymanski
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- Field of study
Real-time monitoring of welding process using air-coupled ultrasonics and acoustic emission
- Author
- A Saha
- A Sumesh
- Alexandra Carmen Basantes-Defaz
- AS Baskoro
- ASTM E2863–17
- ASTM E749/E749M-17
- ASTM E751/E751M-17
- BA Chin
- C Doerr
- CJ Lee
- D Vangi
- DF Farson
- Didem Ozevin
- Ernesto Indacochea
- H Wikle
- J Lee
- J Zhu
- KJ Dharmaraj
- L Grad
- L Wang
- Lu Zhang
- M Miller
- P Sforza
- RE Craine
- S Nagarajan
- SCA Alfaro
- V Kumar
- WJ Zhang
- Y Zhang
- YW Park
- ZM Liu
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- Field of study
A new method for nondestructive quality evaluation of the resistance spot welding based on the radar chart method and the decision tree classifier
- Author
- C Kalonia
- DF Farson
- DT Li
- DW Zhao
- Fujun Wang
- H Tang
- H-T Lee
- HJ Zhang
- HJ Zhang
- HJ Zhang
- Hongjie Zhang
- J Ruisz
- Jianye Zhang
- JR Quinlan
- JZ Chen
- K Zhou
- L Gong
- L Kučšer
- M Amarnath
- M EL-Banna
- M Jou
- M Kimchi
- M Pouranvari
- P Podržaj
- P Podržaj
- PX Zhang
- S Simončič
- SA Gedeon
- SB Kotsiantis
- W Li
- Xiangyang Qi
- Y Cho
- Y Cho
- Y Luo
- Y Wan
- Yanyan Hou
- YS Zhang
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- Field of study
A review of high energy density beam processes for welding and additive manufacturing applications
- Author
- A Ancona
- A Ancona
- A Dass
- A De
- A Giesen
- A Gökhan Demir
- A Hershcovitch
- A Hess
- A Javan
- A Kaplan
- A Kaur
- A Koglbauer
- A Kohyamaa
- A Matsunawa
- A Matsunawa
- A Müller
- A Sanderson
- A Schmailzl
- A Schneider
- A Schneider
- AB Artusio-Glimpse
- AFH Kaplan
- AFH Kaplan
- AFH Kaplan
- AL Schaeffler
- AL Schawlow
- Anon
- AP Mackwood
- B Bandi
- B Qi
- B Ribic
- B-S Kuo
- C Cai
- C Dong
- C Millon
- C Mittelstädt
- C Seo
- C Stadter
- C-H Kim
- C-J Lee
- CE Albright
- CJ Knight
- CJ Koester
- CKN Patel
- CKN Patel
- CKN Patel
- CR Heiple
- CY Ho
- D Kautz
- D McMullan
- D Reitemeyer
- D Rosenthal
- D Rosenthal
- D Trushnikov
- D You
- D You
- DA Schauer
- DB Hann
- DF Farson
- DF Farson
- DKY Low
- DN Trushnikov
- DN Trushnikov
- DY You
- E Akman
- E Assunção
- E Ruska
- E Snitzer
- E Snitzer
- E Taban
- EV Locke
- F Brygo
- F Fetzer
- F Kong
- F Tenner
- FO Olsen
- FW Bach
- G Cam
- G Casalino
- G Hicken
- G Liu
- G Masinelli
- G Schubert
- G Thomas
- GC Lim
- GX Chen
- H Busch
- H Gong
- H Ki
- H Köhler
- H Liu
- H Nakamura
- H Pinto
- H Schwarz
- H Sieurin
- H Taheri
- H Tong
- H Tong
- HL Wei
- HL Wei
- I Eriksson
- I Falconer
- I Smurov
- IA Prudnikov
- J Coroado
- J Dora
- J Dowden
- J Elmer
- J Hecht
- J Kar
- J Mazumder
- J Mazumder
- J Powell
- J Stavridis
- J Verma
- J Volpp
- J Xie
- J Zhang
- J-B Forien
- JA Brooks
- JA Brooks
- JC Ion
- JC Lippold
- JE Geusic
- JJ Blecher
- JJ Blecher
- JL Murphy
- JM Fraser
- JM Jouvard
- JM Sánchez-Amaya
- JM Vitek
- JP Bergmann
- JP Gordon
- JT Norris
- JW Elmer
- JW Elmer
- JY Lee
- K Richter
- K Saida
- K Wasmer
- KY Benyounis
- L Cordova
- L Grad
- L Karlsson
- L Li
- L Liu
- L Mrna
- L Quintino
- L Wang
- LA Shapiro
- LJ Zhang
- M Boley
- M Bolut
- M Doubenskaia
- M Duocastella
- M Gao
- M Gao
- M Harooni
- M Iqbal
- M Jiang
- M Jiang
- M Marko
- M Megahed
- M Pastor
- M Rappaz
- M Rappaz
- M Schmidt
- M Schmoeller
- M Wiesner
- MI Nathan
- MJ Torkamany
- MM Collur
- MS Wȩglowski
- MW Haubold
- N Bidin
- N Eschner
- N Saresh
- O Hammar
- ON Alyackrinskiy
- P Bertrand
- P Burgardt
- P De Bono
- P Kumar
- P Petrov
- PA Williams
- PG Klemens
- PG Riofrío
- PJ DePond
- PJL Webster
- PJL Webster
- PJLL Webster
- PT McCarthy
- PW Fuerschbach
- PY Shcheglov
- R Newman
- R Olsson
- R Rai
- R Trivedi
- R Wyatt
- R Zenker
- RJ Keyes
- RJ Mears
- RN Hall
- RS Coelho
- RS Sharma
- RTC Choo
- S Chiang
- S Chiang
- S Chowdhury
- S Fujinaga
- S Grünenwald
- S Kaierle
- S Katayama
- S Katayama
- S Katayama
- S Lee
- S Shevchik
- S Tammas-Williams
- S Varushkin
- S Wang
- SA David
- SA David
- SA Shevchik
- SE Nielsen
- SG Anderson
- SH Yun
- SK Dinda
- SL Sing
- T Beck
- T DebRoy
- T Liu
- T Miyazaki
- T Miyazaki
- T Mohandas
- T Ogura
- T Scholz
- T Sibillano
- TJ Lienert
- TJ Rockstroh
- TM Quist
- U Dilthey
- U Reisgen
- V Kujanpaa
- V Mamuschkin
- V Muthupandi
- V Patel
- V Semak
- VK Dragunov
- W Andreasch
- W Cai
- W Hofmeister
- W Liu
- W Lu
- W Lu
- W O’Neill
- W Rath
- W Reimann
- W Reimann
- W Sudnik
- WA Ayoola
- WA Clarkson
- WG Baechler
- WH Giedt
- WJ Suder
- WJ Suder
- X Gao
- X He
- Y Ai
- Y Cai
- Y Huang
- Y Kawahito
- Y Kawahito
- Y Kawahito
- Y Kawahito
- Y Kawahito
- Y Kawahito
- Y Luo
- Y Luo
- Y Zhang
- ZY Wang
- ZY Wang
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- Field of study
Femtosecond laser internal manufacturing of three-dimensional microstructure devices
- Author
- A Baum
- A Hu
- A Hu
- A Marcinkevicius
- A Marcinkevičius
- A Miotello
- A Ovsianikov
- Anming Hu
- B-B Xu
- BN Chichkov
- C Hnatovsky
- C Li
- C Li
- C Wochnowski
- C Wochnowski
- C Wochnowski
- C Zheng
- CB Schaffer
- CB Schaffer
- CH Lin
- Chong Zheng
- D Liu
- D Wu
- D Wu
- D Wu
- D Wu
- D Wu
- DF Farson
- DJ Hwang
- E Glezer
- E Stankevičius
- EN Glezer
- F Formanek
- F He
- F Vega
- G Cheng
- G Cojoc
- G Witzgall
- GD Valle
- GY Zhou
- H Huang
- H-B Sun
- H-B Sun
- J Bonse
- J Bonse
- J Gottmann
- J Gottmann
- J Qiu
- J Serbin
- J Si
- J-I Kato
- JM Fernández-Pradas
- JR Lakowicz
- K Choi
- K Hirao
- K Ke
- K Liu
- K Minoshima
- K Minoshima
- K Miura
- K Miura
- K Piglmayer
- K Sugioka
- K Sugioka
- K Sugioka
- K Yamasaki
- K-I Kawamura
- K-S Lee
- KC Vishnubhatla
- Ken D. Oakes
- KK Seet
- KM Davis
- L Romoli
- L Shah
- LC Cheng
- M Albota
- M Hermans
- M Hörstmann-Jungemann
- M Malinauskas
- M Malinauskas
- M Malinauskas
- M Malinauskas
- M Masuda
- M Straub
- M Thiel
- M Watanabe
- MA Burns
- N Yu
- P Scully
- Q Wu
- Q-D Chen
- R An
- R Guo
- R Larciprete
- R Srinivasan
- R Suriano
- RR Gattass
- S Backus
- S He
- S Ho
- S Juodkazis
- S Kawata
- S Kuper
- S Küper
- S Küper
- S Maruo
- S Matsuo
- S Nakashima
- S Nolte
- S Preuss
- S Preuss
- S Preuss
- S Preuss
- S Sowa
- Shibing Liu
- T Brabec
- T Kondo
- Tao Chen
- TW Lim
- VR Bhardwaj
- W Kaiser
- W Watanabe
- W Watanabe
- W Watanabe
- W Zhou
- X Zhou
- Y Bellouard
- Y Bellouard
- Y Cheng
- Y Cheng
- Y Cheng
- Y Cheng
- Y Cheng
- Y Cheng
- Y He
- Y Hu
- Y Iga
- Y Kondo
- Y Li
- Y Li
- Y Li
- Y Li
- Y Liao
- Y Liao
- Y Liao
- Y-L Zhang
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- Field of study