Growth And Characterization Of Gaalas/gaas And Gainas/inp Structures: The Effect Of A Pulse Metalorganic Flow

GaAlAs/GaAs and GaInAs/InP thick layers, single and multiple quantum wells were grown by atmospheric pressure metalorganic vapor phase epitaxy. Auger electron spectroscopy, wedge transmission electron microscopy, x-ray diffraction, low-temperature photoluminescence, and scanning electron microscopy were used to analyze the crystal quality. These analysis techniques show that layers grown using high vapor pressure metalorganic sources present fluctuations in the ternary alloy composition. We propose that these fluctuations are due to the pulse character of the high vapor pressure metalorganic flow. Bubbling experiments were performed to show the relationship between ternary layer composition fluctuation and the pulse character of the metalorganic flow. High vapor pressure metalorganic source like trimethylgallium presents tens of Angströms growth rate per pulse or bubble whereas a low vapor pressure source like triethylgallium presents few Angströms growth rate per bubble.71117918

Optical And Structural Investigation Of In 1-xga Xp Free-standing Microrods

We present a structural and optical characterization of scepterlike micrometer-sized free-standing structures, composed of a long InGaP rod with a metallic sphere on its top, grown on polycrystalline InP substrates. In contrast to the conventional vapor-liquid-solid growth method, no catalyst was deposited on the substrate. Instead, metallic In liberated from the InP substrate by phosphor evaporation works as the catalyst metal. We performed Raman scattering, photoluminescence spectroscopy, scanning electron microscopy, and energy dispersive x-ray spectroscopy measurements on individual structures. The alloy composition measured by microscopic techniques is in agreement with the values obtained by the optical measurements considering that the rod is strain free. The InGaP rods present essentially constant Ga composition within a fluctuation of ∼10% and efficient optical emission. We also observed a marked increase in the Raman-scattering signal at rod positions near the metallic sphere (the "neck"), which was attributed to a surface-enhanced Raman-scattering effect. Our results demonstrate the possibility of using InGaP rods for optical device applications. © 2005 American Institute of Physics.985Chen, C.-C., Yeh, C.-C., (2000) Adv. Mater. (Weinheim, Ger.), 12, p. 738Gupta, R., Xiong, Q., Mahan, G.D., Eklund, P.C., (2003) Nano Lett., 3, p. 1745Chen, C.-C., (2001) J. Am. Chem. Soc., 123, p. 2791Krishnamachari, U., Borgstrom, M., Ohlsson, B.J., Panev, N., Samuelson, L., Seifert, W., Larsson, M.W., Wallenberg, L.R., (2004) Appl. Phys. Lett., 85, p. 2077Ye, D.-X., Karabacak, T., Lim, B.K., Wang, G.-C., Lu, T.-M., (2004) Nanotechnology, 15, p. 817Wang, R.P., Xu, G., Jin, P., (2004) Phys. Rev. B, 69, p. 113303Jie, J., (2004) J. Phys. Chem. B, 108, p. 8249Hu, J., Odom, T.W., Lieber, C.M., (1999) Acc. Chem. Res., 32, p. 435Wagner, R.S., Ellis, W.C., (1964) Appl. Phys. Lett., 4, p. 89Park, W.I., Kim, D.H., Jung, S.-W., Yi, G.-C., (2002) Appl. Phys. Lett., 80, p. 4232Morales, A.M., Lieber, C.M., (1998) Science, 279, p. 208Choi, H.-J., (2003) J. Phys. Chem. B, 107, p. 8721Sacilotti, M., Decobert, J., Sik, H., Post, G., Dumas, C., Viste, P., Patriarche, G., (2004) J. Cryst. Growth, 272, p. 198Gudisken, M., Lieber, Ch., (2000) J. Am. Chem. Soc., 122, p. 8801Gudisken, M., Wang, J., Lieber, Ch., (2001) J. Phys. Chem. B, 105, p. 4062Kato, T., Matsumoto, T., Ishida, T., (1988) Jpn. J. Appl. Phys., Part 1, 27, p. 983Zachau, M., Masselink, W.T., (1992) Appl. Phys. Lett., 60, p. 2098Beserman, R., Hirlimann, C., Balkanski, M., (1976) Solid State Commun., 20, p. 485Abdelouhab, R.M., Braunstein, R., Bärner, K., Rao, M.A., Kroemer, H., (1989) J. Appl. Phys., 66, p. 787Jusserand, B., Slempkes, S., (1984) Solid State Commun., 49, p. 95Xu, H., Aizpurua, J., Käll, M., Apell, P., (2000) Phys. Rev. e, 62, p. 4318Suzuki, M., Niidome, Y., Terasaki, N., Inoue, K., Kuwahara, Y., Yamada, S., (2004) Jpn. J. Appl. Phys., Part 2, 43, p. 554Mahan, G.D., Gupta, R., Xiong, Q., Adu, C.K., Eklund, P.C., (2003) Phys. Rev. B, 68, p. 073402Gordon, B.E., Lee, A.S.W., Thompson, D.A., Robinson, B.J., (2003) Semicond. Sci. Technol., 18, p. 782Sacilotti, M., Masut, R.A., Roth, A.P., (1986) Appl. Phys. Lett., 48, p. 481Deibuk, V.G., (2003) Semiconductors, 37, p. 1151Schuler, O., Wallart, X., Mollot, F., (1999) J. Cryst. Growth, 201, p. 280Wei, S.-H., Ferreira, L.G., Zunger, A., (1990) Phys. Rev. B, 41, p. 8240Vavilova, L.S., (1998) Semiconductors, 32, p. 590Lee, R.T., Fetzer, C.M., Jun, S.W., Chapman, D.C., Shurtleff, J.K., Stringfellow, G.B., Ok, Y.W., Seong, T.Y., (2001) J. Cryst. Growth, 233, p. 490Bernussi, A.A., Carvalho Jr., W., Franco, M.K.K.D., (2001) J. Appl. Phys., 89, p. 489

Optical and structural investigation of In1-xGaxP free-standing microrods

We present a structural and optical characterization of scepterlike micrometer-sized free-standing structures, composed of a long InGaP rod with a metallic sphere on its top, grown on polycrystalline InP substrates. In contrast to the conventional vapor-liquid-solid growth method, no catalyst was deposited on the substrate. Instead, metallic In liberated from the InP substrate by phosphor evaporation works as the catalyst metal. We performed Raman scattering, photoluminescence spectroscopy, scanning electron microscopy, and energy dispersive x-ray spectroscopy measurements on individual structures. The alloy composition measured by microscopic techniques is in agreement with the values obtained by the optical measurements considering that the rod is strain free. The InGaP rods present essentially constant Ga composition within a fluctuation of similar to 10% and efficient optical emission. We also observed a marked increase in the Raman-scattering signal at rod positions near the metallic sphere (the "neck"), which was attributed to a surface-enhanced Raman-scattering effect. Our results demonstrate the possibility of using InGaP rods for optical device applications. (c) 2005 American Institute of Physics.98