247 research outputs found

    Fast positronium formation and dissociation at surfaces

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    The origin of shortā€lived components in the annihilation lifetime spectrum of positronium (Ps) is shown to be due to fast Ps that is collisionally dissociating at the surfaces of the surrounding confinement cavity. The results are consistent with a model of fast (10ā€“100 eV) Ps production by backscattered positrons from the incident beam. It is found that the typical lifetime of dissociating Ps scales with the mean free path of the cavity, and the relative formation intensity depends inversely on the incident positron beam energy. This ubiquitous effect will be present in any Ps formation experiment involving a free surface and can only be eliminated at beam energies less than 10 eV. More practical methods of minimizing the undesirable systematic effects of fast Ps quenching in depthā€profiled positron lifetime spectroscopy and in precision Ps decay rate measurements will be discussed. Ā© 1995 American Institute of Physics.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/70565/2/JAPIAU-78-3-1406-1.pd

    Reā€emitted positron spectroscopy of cobalt and nickel silicide films

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    The techniques of reā€emitted positron spectroscopy (RPS) have been employed in the first systematic investigation of the positronic properties of the various stoichiometric phases (M2Si, MSi, and MSi2) of Co and Ni silicide films grown in situ on Si substrates. The positron work function is found to be negative for all of the different phases; thus implanted positrons may be reā€emitted. The energy of the reā€emitted positrons is found to have a surprisingly large variation for the different phases. This feature should provide the image contrast necessary to observe each phase on a microscopic scale using the positron reā€emission microscope (PRM). The positron deformation potential, E+dā‰”V(āˆ‚Ī£/āˆ‚V), was determined for CoSi2 films; it can be used to estimate the size of the positron diffusion constant, which is found to be comparable to that of other metals. Thus the short positron diffusion length (of order 150 ƅ) determined from depthā€profiling measurements of CoSi2 films must be a result of positron trapping in either the film or at the interface with the Si substrate. RPS results considered as a function of film thickness support the conclusion that defects in the film (misfit dislocations and/or vacancies) represent the major source of positron trapping.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/87603/2/264_1.pd

    Positron tunneling microscopy

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    A new technique for analyzing thin film growth processes, called positron tunneling microscopy (PTM), is proposed as an extension of the recently developed positron reemission microscope. The unique feature of a PTM is that image contrast is provided by the exponential reemission probability for positrons tunneling through thin-film overlayers that present an energy barrier to reemission. Results of positron tunneling experiments show that PTM should have monolayer thickness resolution to processes that locally affect either the tunneling barrier's width, such as islanding and subsurface roughness, or the barrier's energy, such as lattice strain in pseudomorphic growth and compositional mixing in interdiffusion alloying. In the case of these latter effects where there may be no topological contrasts at all, experimental results are discussed in greater detail. Comparisons of PTM with existing electron microscopies are presented where appropriate.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/28554/1/0000356.pd

    Characteristics of starch-based films with different amylose contents plasticised by 1-ethyl-3-methylimidazolium acetate

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    Starch-based films plasticised by an ionic liquid, 1-ethyl-3-methylimidazolium acetate ([Emim][OAc]), were prepared by a simple compression moulding process, facilitated by the strong plasticisation effect of [Emim][OAc]. The effects of amylose content of starch (regular vs. high-amylose maize) and relative humidity (RH) during ageing of the samples on a range of structural and material characteristics were investigated. Surprisingly, plasticisation by [Emim][OAc] made the effect of amylose content insignificant, contrary to most previous studies when other plasticisers were used. In other words, [Emim][OAc] changed the underlying mechanism responsible for mechanical properties from the entanglement of starch macromolecules (mainly amylose), which has been reported as a main responsible factor previously. The crystallinity of the plasticised starch samples was low and thus was unlikely to have a major contribution to the material characteristics, although the amylose content impacted on the crystalline structure and the mobility of amorphous parts in the samples to some extent. Therefore, RH conditioning and thus the sample water content was the major factor influencing the mechanical properties, glass transition temperature, and electrical conductivity of the starch films. This suggests the potential application of ionic liquid-plasticised starch materials in areas where the control of properties by environmental RH is desired

    Thermalization of Positronium in Gases

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    The thermalization of positronium ( Ps) formed at a few eV in gases is investigated using timeresolved, Doppler broadening measurements of the annihilation photons. Magnetic quenching permits energy measurements about 40 ns after Ps is formed in H 2 , N 2 , He, Ne, Ar, isobutane, and neopentane. The thermalization rate is measured by changing the gas density, and a classical elastic scattering cross section and a Ps formation energy are determined. The impact of Ps thermalization on decay rate experiments using gases is also discussed. [S0031-9007(98) PACS numbers: 36.10. Dr, 34.50.Bw, 78.70.Bj Collisions between normal gas atoms and the exotic atom positronium (Ps, positron-electron bound state) are interesting and unique because Ps is so light relative to its target. Hence Ps, formed at typically a few eV in most gases, will thermalize very slowly if elastic scattering is the only available energy loss mechanism. In the elastic case, the fractional energy loss per collision is only of order mĶžM Ļ³ 10 24 (m is the Ps mass, M is the atomic/molecular mass.) The low energy Ps-atom collision is also inherently quantum mechanical in nature since the de Broglie wavelength of Ps below 1 eV is greater than 9 ƅ, larger than the classical geometric atomic size. Moreover, it was recognized early [1] that cross section calculations must include the polarization/Van der Waals interaction and electron exchange. These features apparently complicate the calculations of cross sections, done presently including the exchange interaction for only oneand two-electron systems scattering Ps (H: [2]; H 2 : [3]; He: Positronium as a scattering probe offers a unique experimental advantage since its annihilation into two photons provides a mechanism for determining its velocity and hence the rate of thermalization and the momentum transfer cross section Ķ‘s m Ķ’ for gas targets. Previous measurements of Ps thermalization in gases In this Letter, we report the measurement of Ps thermalization rates, formation energies, and momentum transfer cross sections in purely gaseous target using time-resolved Doppler Broadening Spectroscopy (DBS). In this complementary technique to ACAR, the Doppler broadening of the back-to-back annihilation photons observed in a single high-resolution Ge detector is a measure of the longitudinal momentum of the annihilating Ps. Timing information as well as DBS is derived from the Ge detector signal, enabling the direct correlation between age and energy of the Ps to be determined. The rate of thermalization and the average formation energy of Ps can then be determined. The gases used in this investigation include He, H 2 , and Ar for comparison to the theoretical calculations The thermalization rate of Ps in a noble gas was calculated 30 years ago by Sauder [14], under the assumption of classical elastic scattering, i.e., an energy-independent cross section for energy loss (momentum transfer) s m which was interpreted as the classical geometrical atomic cross section. If Ps is formed at only a few eV, below the 5.1 eV threshold for excitation of the Ps or the noble gas Ķ‘.10 eVĶ’ and slow enough to avoid collisional dissociation, Sauder's elastic model may be appropriate. The Ps kinetic energy EĶ‘tĶ’, as it asymptotically approaches thermal energy, E th , is given by where b is related to the average initial energy E 0 of Ps that can eventually thermalize: coth 2 b E 0 ĶžE th . G is 0031-9007Ķž98Ķž80(17)Ķž3727(4)$15.0

    An overview of the Michigan Positron Microscope Program

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    An overview of the Michigan Positron Microscope Program is presented with particular emphasis on the second generation microscope that is presently near completion. The design and intended applications of this microscope will be summarized.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/87602/2/391_1.pd

    Carbonā€Enriched Amorphous Hydrogenated Boron Carbide Films for Veryā€Lowā€k Interlayer Dielectrics

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    A longstanding challenge in ultralargeā€scale integration has been the continued improvement in lowā€dielectricā€constant (lowā€k) interlayer dielectric materials and other specialized layers in backā€endā€ofā€theā€line interconnect fabrication. Modeled after the success of carbonā€containing organosilicate materials, carbonā€enriched amorphous hydrogenated boron carbide (aā€BxC:Hy) films are grown by plasmaā€enhanced chemical vapor deposition from orthoā€carborane and methane. These films contain more extraicosahedral sp3 hydrocarbon groups than nonenriched aā€BxC:Hy films, as revealed by FTIR and NMR spectroscopy, and also exhibit lower dielectric constants than their nonenriched counterparts, notably due to low densities combined with a low distortion and orientation contribution to the total polarizability. Films with dielectric constant as low as 2.5 are reported with excellent electrical stability (leakage current of 10āˆ’9 A cmāˆ’2 at 2 MV cmāˆ’1 and breakdown voltage of >6 MV cmāˆ’1), good thermal conductivity of 0.31 Ā± 0.03 W māˆ’1 Kāˆ’1, and high projected Youngā€™s modulus of 12 Ā± 3 GPa. These properties rival those of leading SiOC:H materials, and position aā€BxC:Hy as an important complement to traditional Siā€based materials to meet the complex needs of nextā€generation interconnect fabrication.Carbonā€enriched amorphous hydrogenated boron carbide films are demonstrated with dielectric constant (k) as low as 2.5ā€”attributed to low densities combined with networkā€rigidifying CH2 bridging groupsā€”as well as excellent electrical, thermal, and mechanical properties, rivaling those of stateā€ofā€theā€art siliconā€based lowā€k dielectric materials.Peer Reviewedhttps://deepblue.lib.umich.edu/bitstream/2027.42/141869/1/aelm201700116_am.pdfhttps://deepblue.lib.umich.edu/bitstream/2027.42/141869/2/aelm201700116.pd

    Freshwater Tertiary of northwestern Texas

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    p. 617-635, [7] leaves of plates (1 folded) : ill., maps ; 24 cm.Includes bibliographical references."Following is a summary of the conclusions reached by the writer from this study of the formations of northwestern Texas: (1) There has been no great disturbance or change of level in the region of the Staked Plains since the close of the Triassic, hence the strata of the Triassic which underlie this whole region are for the most part nearly horizontal, and the country at the beginning of the Miocene was comparatively level. (2) The Panhandle (Lower or Middle Miocene) beds were comparatively evenly distributed over the vast area now occupied by the Staked Plains and in addition extended westward to the Rocky Mountains in New Mexico, and spread out to the eastward over a much greater territiory than they now occupy. These deposits seem to be, at least partially, lacustrine in origin. (3) All the formations of the Staked Plains that are of more recent date than the Lower or Middle Miocene are represented by comparatively small areas, and are fluviatile, or aeolian and fluvaiatile, in origin. These later depositions are represented by the Clarendon beds in the vicinity of Clarendon, the Blanco Beds at Mount Blanco, and the Rock Creek beds at Tule CaƱon and Rock Creek"--P. 635
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