108,128 research outputs found
Fractal atomic-level percolation in metallic glasses
Metallic glasses are metallic alloys that exhibit exotic material properties. They may have fractal structures at the atomic level, but a physical mechanism for their organization without ordering has not been identified. We demonstrated a crossover between fractal short-range (<2 atomic diameters) and homogeneous long-range structures using in situ x-ray diffraction, tomography, and molecular dynamics simulations. A specific class of fractal, the percolation cluster, explains the structural details for several metallic-glass compositions. We postulate that atoms percolate in the liquid phase and that the percolating cluster becomes rigid at the glass transition temperature
Tracking Report 2011 Pou Chen, Indonesia 070033435J
This document is part of a digital collection provided by the Martin P. Catherwood Library, ILR School, Cornell University, pertaining to the effects of globalization on the workplace worldwide. Special emphasis is placed on labor rights, working conditions, labor market changes, and union organizing.FLA_2011_Pou_Chen_TR_Indonesia_070033435J.pdf: 9 downloads, before Oct. 1, 2020
X-ray Diffraction Tomographic Imaging and Reconstruction
Material discrimination based on conventional or dual energy X-ray computed tomography (CT) imaging can be ambiguous. X-ray diffraction imaging (XDI) can be used to construct diffraction profiles of objects, providing new molecular signature information that can be used to characterize the presence of specific materials. Combining X-ray CT and diffraction imaging can lead to enhanced detection and identification of explosives in luggage screening. In this work we are investigating techniques for joint reconstruction of CT absorption and X-ray diffraction profile images of objects to achieve improved image quality and enhanced material classification. The initial results have been validated via simulation of X-ray absorption and coherent scattering in 2 dimensions.U. S. Department of Homeland Security (2008-ST-061-ED0001
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