A review of curve fitting error criteria for solar cell I-V characteristics

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Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model

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Experimentally observed deviations from the superposition principle in crystalline silicon solar cells at low illuminations

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A new gate current measurement technique for the characterization of hot-carrier induced degradation in MOSFETs

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Plasmodium falciparum pyruvate kinase as a novel target for antimalarial drug-screening

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A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan

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Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm

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Investigation of the role of hot holes and hot electrons in the generation of interface states in submicrometre MOSFETs using a new charge-profiling technique based on charge-pumping measurements

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New purely-experimental technique for extracting the spatial distribution of hot-carrier-induced interface states and trapped charges in MOSFETs

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Determination of substrate doping, substrate carrier lifetime and density of surface recombination centres of MOSFETs by gate-controlled-diode measurements

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