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1 research outputs found
The lattice parameter of silicon: a secondary realisation of the metre
Author
+46 more
Andrew Yacoot
Bartl G
Becker P
BIPM
BIPM
BIPM
BIPM
BIPM
BIPM
Buhr E
Campbell A C
Carmignato S
Celik M
Chaikool P
Dai G
Dai G
Dai G
Durand M
Editor’s Note
Feynman R P
Fu J
Garnes J
Harald Bosse
Hart M
Homma Y
ISO 10360 7
ISO 5436-1:2000
Leach R K
Luther W
Martin J
Massa E
Melis C
Nečas D
Pisani M
Rerucha S
Roco M C
Ron Dixson
Tortonese M
Tsai V W
Weichert C
WGDM-7 Preliminary Comparison on nanometrology according to the rules of CCL key comparisons
Yacoot A
Yacoot A
Yacoot A
Yacoot A
Yacoot A
Publication venue
'IOP Publishing'
Publication date
Field of study
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