Black phosphorus: narrow gap, wide applications

The recent isolation of atomically thin black phosphorus by mechanical exfoliation of bulk layered crystals has triggered an unprecedented interest, even higher than that raised by the first works on graphene and other two-dimensional, in the nanoscience and nanotechnology community. In this Perspective we critically analyze the reasons behind the surge of experimental and theoretical works on this novel two-dimensional material. We believe that the fact that black phosphorus band gap value spans over a wide range of the electromagnetic spectrum that was not covered by any other two-dimensional material isolated to date (with remarkable industrial interest such as thermal imaging, thermoelectrics, fiber optics communication, photovoltaics, etc), its high carrier mobility, its ambipolar field-effect and its rather unusual in-plane anisotropy drew the attention of the scientific community towards this two-dimensional material. Here we also review the current advances, the future directions and the challenges in this young research field.Comment: Updated version of the perspective article about black phosphorus, including all the feedback received from arXiv users + reviewer

Calibration of piezoelectric positioning actuators using a reference voltage-to-displacement transducer based on quartz tuning forks

We use a piezoelectric quartz tuning fork to calibrate the displacement of ceramic piezoelectric scanners which are widely employed in scanning probe microscopy. We measure the static piezoelectric response of a quartz tuning fork and find it to be highly linear, non-hysteretic and with negligible creep. These performance characteristics, close to those of an ideal transducer, make quartz transducers superior to ceramic piezoelectric actuators. Furthermore, quartz actuators in the form of a tuning fork have the advantage of yielding static displacements comparable to those of local probe microscope scanners. We use the static displacement of a quartz tuning fork as a reference to calibrate the three axis displacement of a ceramic piezoelectric scanner. Although this calibration technique is a non-traceable method, it can be more versatile than using calibration grids because it enables to characterize the linear and non-linear response of a piezoelectric scanner in a broad range of displacements, spanning from a fraction of a nanometer to hundreds of nanometers. In addition, the creep and the speed dependent piezoelectric response of ceramic scanners can be studied in detail.Comment: 9 pages, 3 figure