8 research outputs found
COST-EFFECTIVENESS OF NEEDLE AND CATHETER OVER NEEDLE WITH ACTIVE PROTECTION DEVICES IN THE HOSPITAL SETTING
Prevalência de deficiência auditiva referida e fatores associados em uma população de idosos da cidade de Manaus: um estudo de base populacional
Sputtering and coloration process in LiF thin layers induced by MeV ion bombardment
Beams of 2.0 MeV nitrogen ions, produced by a Van de Graaff generator, were used in order to create point defects in polycrystalline LiF thin films. The radiation effects were examined by optical absorption, RES, PDMS and XPS methods. The concentration of the produced F-centers exhibits a saturation behavior, but decreases for doses higher than similar to 1 x 10(16)cm(-2). A fluorine sputtering yield Y similar to 3 was determined by using RES. Moreover, XPS and PDMS techniques detected surface Li enrichment as a result of the ion bombardment. All these results denote the relevance of the sputtering in the de-coloration process of LIF thin layers