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3 research outputs found
Thin Film Thickness and Grain Structure Determination of Ferroelectric SrBi2Ta2O9 with Cross-Sectional Atomic Force Microscopy
Author
A.H. Lehman
C. Caragianis-Broadbridge
+4 more
D.L. Pechkis
J.-P. Han
K. L. Klein
T. P. Ma
Publication venue
'Cambridge University Press (CUP)'
Publication date
Field of study
No full text
Crossref
How Processing Atmosphere Influences the Evolution of GeO 2
Author
Adhikari H.
Alivisatos A. P.
+42 more
Ardyanian M.
Batra Y.
Belot V.
Beyer V.
Bostedt C.
Brunco D. P.
Burns G. T.
Canham L. T.
Caragianis-Broadbridge C.
Chew H. G.
Choi W. K.
Compagnoni C. M.
Daly B.
El Hdiy A.
Erogbogbo F.
Hanrath T.
Hanrath T.
Heath J. R.
Henderson E. J.
Henderson E. J.
Hessel C. M.
Hessel C. M.
Hohl A.
Kanoun M.
Kortshagen U.
Li Z. F.
Lombardo S.
Lopeandía A. F.
Molle A.
Molle A.
Paine D. C.
Pavesi L.
Ravel B.
Schmeisser D.
Sham T. K.
Sun X. H.
Sychugov I.
Veinot J. G. C.
Walters R. J.
Whitesides G. M.
Zacharias M.
Zanatta A. R.
Publication venue
'American Chemical Society (ACS)'
Publication date
Field of study
No full text
Crossref
The electrical properties and stability of the hafnium silicate/Si0.8Ge0.2(100) interface
Author
A. Callegari
A. Sareen
+45 more
B. E. Gnade
B.H. Lee
C. Caragianis-Broadbridge
C.H. Huang
C.K. Maiti
D.K. Nayak
E.H. Nicollian
F. Goutaland
G.D. Wilk
G.D. Wilk
H. Itoh
J. Morais
J.F. Conley Jr.
J.P. Maria
K. Awazu
K. Kukli
K. Vanheusden
M. Copel
M. Copel
M. J. Kim
M. Mukhopadhyay
M.-A. Nicolet
M.A. Quevedo-Lopez
M.J. Palmer
M.L. Reed
P. Sivasubramani
R. M. Wallace
R.E. Stahlbush
S. Addepalli
S. Addepalli
S. Gan
S. Gopalan
S. Pal
S. Ramanathan
S.-W. Nam
S.M. Sze
T. Ngai
T. Ngai
W.K. Henson
W.L. Warren
W.S. Liu
W.S. Liu
W.S. Liu
Y. Nissan-Cohen
Z. Shi
Publication venue
'Springer Science and Business Media LLC'
Publication date
Field of study
No full text
Crossref