Investigation of the Electric Field and Charge Density Distribution of pristine and defective 2D WSe2_2 by Differential Phase Contrast Imaging

Most properties of solid materials are defined by their internal electric field and charge density distributions which so far have been difficult to measure with sufficient spatial resolution. For 2D materials, the electric field at the atomic level in particular influences the optoelectronic properties. In this study, the atomic-scale electric field and charge density distribution of 2D WSe$_2$ are revealed by using an emerging microscopy technique, differential phase contrast (DPC) imaging in the scanning transmission electron microscope (STEM). Combined with high-angle annular dark-field imaging the charge density distribution of bi- and trilayers of WSe$_2$ is mapped. A measured higher positive charge density located at the selenium atomic columns compared to the tungsten atomic columns is reported, and possible reasons are discussed. Furthermore, the change in the electric field distribution of a selenium point defect in a trilayer is investigated exhibiting a characteristic electric field distribution in the vicinity of the defect: there are characteristic regions with locally enhanced and with locally reduced electric field magnitudes compared to the pristine lattice.Comment: 20 pages including the supplementary information, 3 figures in the main part and additional 2 figures in the supplementary informatio