1 research outputs found
Interface characterization of Co2MnGe/Rh2CuSn Heusler multilayers
All-Heusler multilayer structures have been investigated by means of high
kinetic x-ray photoelectron spectroscopy and x-ray magnetic circular dichroism,
aiming to address the amount of disorder and interface diffusion induced by
annealing of the multilayer structure. The studied multilayers consist of
ferromagnetic CoMnGe and non-magnetic RhCuSn layers with varying
thicknesses. We find that diffusion begins already at comparably low
temperatures between 200 C and 250 C, where Mn appears to
be most prone to diffusion. We also find evidence for a 4 {\AA} thick
magnetically dead layer that, together with the identified interlayer
diffusion, are likely reasons for the small magnetoresistance found for
current-perpendicular-to-plane giant magneto-resistance devices based on this
all-Heusler system