A study of Ni-based refractory alloys via anomalous scattering techniques

Anomalous x-ray scattering methods provided means to probe the local interactions of specific chemical pairs in a Ni–Nb–Sn sequence. Data near and far from the absorption edges of individual constituent atoms were obtained to calculate differential distribution functions, revealing the atomic arrangements. The compositional fluctuations throughout a typical Ni60Nb40−xSnyNi60Nb40−xSny sample is described as alternating Ni-rich and Nb-rich clusters of ∼ 25 Å∼25Å dimensions. This nonrandom distribution of atomic species may partially explain the failure of previous modeling efforts of bulk metallic glasses to explain their mechanical behavior and thermal stability.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/87755/2/074906_1.pd

Understanding cost variations in STD service delivery as state and federal agencies reduce funding

Sexually transmitted diseases (STD) continue to be a major health problem in the U.S. Despite the persistence of STDs and the critical role of the public health sector in controlling these diseases, STD services continue to be reduced. A linear regression was performed using county demographic and cost variables. Many of these variables in county public health agencies and the populations they serve were not significantly correlated with cost of service. However, the availability of local tax funding for county health departments (CHDs), which varies extensively across counties within the state, is statistically linked to higher STD expenditure per case. County STD rates were also negatively correlated with cost of service. As the STD rate increases, the cost per STD case decreases implying some economies of scale. County population size did not have any effect on the cost per case. Understanding the factors contributing to the unit costs of STD services is critical to be able to make actionable and prudent decisions about continued financial support for public health agency based STD prevention/control services

ANTERIOR OPEN BITE TREATED WITH E F APPLIANCE: A CASE REPORT

Aim. Current trends in pediatric orthodontics aim to identify incorrect development of occlusion and medium/lower facial third as early as possible. Functional appliances are a popular type of device used for treating malocclusion in patients who are growing. Among the functional orthodontic devices intended for this purpose, \u201cEducation Functional\u201d is highlighted. It was developed by Dr. Daniel Rollet. In fact, in the occlusal alterations, early preventive treatment with elastodontic devices resulted in avoiding dysfunctional forces from acting on the skeletal pattern, thus reaching a balance between bone basis and muscular components. This report describes a clinical case of a patient (9-year-old female) with anterior open bite associated to oral dysfunction, treated, in the mixed dentition, with EF-line appliance. Our purpose is to evaluate the effectiveness of this device for the correction of the dysmorphoses

Combined transmission electron microscopy and x‐ray study of the microstructure and texture in sputtered Mo films

The microstructure and texture of thin Mo films sputtered onto the native oxide of Si(100) wafers were investigated with both conventional reflection x‐ray pole figures, and transmission electron microscopy and diffraction. Films were grown at two deposition rates (powers), 34 nm/min (1.5 kW) and 67 nm/min (3.9 kW), onto both moving and stationary substrates, under otherwise identical experimental conditions. The microstructure of the Mo films evolved into a zone 2 microstructure within the first 2 μm of growth. The development of both out‐of‐plane and in‐plane textures was found to be influenced by deposition rate and geometry. Films grown at the lower deposition rate exhibited predominantly {110} textures, while films grown at the higher rate exhibited predominantly {110} textures up to a film thickness of ∼0.5 μm and {111} textures above a film thickness of ∼1 μm. Films with the {110} textures developed grains with elongated footprints and faceted surfaces, while films with the {111} textures developed grains with elongated triangular footprints and faceted surfaces. In all of the films deposited onto moving substrates, an alignment of the grains normal to the tangent plane (defined by the substrate normal and the direction of platen rotation) was observed. In all of the films deposited onto stationary substrates, the development of an in‐plane texture was suppressed. These results suggest that a combination of geometric, energetic, and kinetic mechanisms are contributing to the evolution of the microstructure and texture in the Mo films.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/70000/2/JAPIAU-76-8-4610-1.pd

Growth anisotropy and self-shadowing: A model for the development of in-plane texture during polycrystalline thin-film growth

The development of a preferred crystallographic orientation in the plane of growth, an in-plane texture, is addressed in a model that incorporates anisotropic growth rates of a material and self-shadowing. Most crystalline materials exhibit fast growth along certain crystallographic directions and slow growth along others. This crystallographic growth anisotropy, which may be due to differences in surface free energy and surface diffusion, leads to the evolution of specific grain shapes in a material. In addition, self-shadowing due to an obliquely incident deposition flux leads to a variation in in-plane grain growth rates, where the “fast” growth direction is normal to the plane defined by the substrate normal and the incident flux direction. This geometric growth anisotropy leads to the formation of elongated grains in the plane of growth. Neither growth anisotropy alone can explain the development of an in-plane texture during polycrystalline thin-film growth. However, whenever both are present (i.e., oblique incidence deposition of anisotropic materials), an in-plane texture will develop. Grains that have “fast” crystallographic growth directions aligned with the “fast” geometric growth direction overgrow grains that do not exhibit this alignment. Furthermore, the rate of texturing increases with the degree of each anisotropy. This model was used to simulate in-plane texturing during thin-film deposition. The simulation results are in excellent quantitative agreement with recent experimental results concerning the development of in-plane texture in sputter deposited Mo films. © 1997 American Institute of Physics.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/71031/2/JAPIAU-82-3-1397-1.pd

A novel identification procedure from ambient vibration data

Ambient vibration modal identification, also known as Operational Modal Analysis, aims to identify the modal properties of a structure based on vibration data collected when the structure is under its operating conditions, i.e., no initial excitation or known artificial excitation. This procedure for testing and/or monitoring historic buildings, is particularly attractive for civil engineers concerned with the safety of complex historic structures.However, since the external force is not recorded, the identification methods have to be more sophisticated and based on stochastic mechanics. In this context, this contribution will introduce an innovative ambient identification method based on applying the Hilbert Transform, to obtain the analytical representation of the system response in terms of the correlation function. In particular, it is worth stressing that the analytical signal is a complex representation of a time domain signal: the real part is the time domain signal itself, while the imaginary part is its Hilbert transform. A 3DOF numerical example will be presented to show the accuracy of the proposed procedure, and comparisons with data from other methods assess the reliability of the approach. Finally, the identification method will be extended to the real case study of the Chiaramonte Palace, a historic building located in Palermo and known as “Steri”

Enhancing Sexually Transmitted Infection Notification: A Quality Improvement Collaborative Case Report

This case study illustrates how a quality improvement (QI) Collaborative supports an implementation study of using mobile phone texting technology for notification of sexually transmitted infections (STI) test results. The County Health Departments making up the QI Collaborative meet monthly to discuss their progress in using QI to advance the use of texting for STI test results. The main purpose of QI Collaboratives is to maximize implementation outcomes through sharing of successes and challenges. The case study report describes how implementation research can adapt to the context of each unique CHD and the users of new knowledge rather than emphasizing the creation of new knowledge

Surface roughness and in-plane texturing in sputtered thin films

Real surfaces are not flat on an atomic scale. Studying the effects of roughness on microstructural evolution is of relevance because films are sputtered onto nonideal surfaces in many applications. To this end, amorphous rough substrates of two different morphologies, either elongated mounds or facets, were fabricated. The microstructural development of films deposited onto these surfaces was examined. In particular, the development of a preferred crystallographic orientation in the plane of growth in 400 nm thick Mo films grown on the rough substrates was studied using scanning electron microscopy, transmission electron diffraction, and high resolution x-ray diffraction (using ϕ scans in the symmetric grazing incidence x-ray scattering geometry with a synchrotron light source). It was found that the degree of texturing was dependent upon the type of roughness and its orientation during deposition. By limiting the average oblique angle of incident adatom flux, rough surfaces slowed the development of in-plane texture. Comparison between experimental data and theoretical predictions showed that a recent analytical model is able to reasonably predict the degree of texturing in films grown onto these surfaces. © 1998 American Institute of Physics.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/70129/2/JAPIAU-84-3-1346-1.pd

Growth textures of thick sputtered films and multilayers assessed via synchrotron transmission Laue

The growth textures of thick sputtered Mo metallizations and Mo/W multilayers, were characterized via a synchrotron white‐beam (WB) x‐ray transmission Laue technique. Transmission x‐ray diffraction studies of Mo specimens up to 61 μm thick were performed with WB synchrotron radiation; while the practical thickness limit for similar observations using a conventional laboratory Cu K(α) x‐ray source is ten times smaller. This unique approach used polychromatic x rays to simultaneously produce diffraction from a wide spread of orientations of many crystallographic planes for all the grains within a relatively large specimen volume (≊60×106 μm3). These patterns were obtained for polycrystalline 31‐ and 61‐μm‐thick Mo/W multilayer specimens, and a 35‐μm‐thick‐monolithic Mo foil specimen. In all three cases the alignment of specimen grains was similar to what would be expected for single‐crystal transmission patterns, except that the recorded intensity distributed was less localized. The WB transmission images were indexed using a reciprocal space construction for the Laue case. In the multilayers, the grains were oriented out‐of‐plane such that 〈110〉 crystallographic planes were aligned in the direction of sputter growth, while in the monolithic Mo specimen 〈111〉 crystallographic planes were so aligned, i.e., perpendicular to the deposition substrate. A spread in orientation of ∼5° was measured in the multilayer specimens, while the monolithic Mo specimen showed a spread of ∼30° when compared to a perfect single‐crystal orientation. Preferred orientation was also observed within the plane of growth to varying degrees for all three samples. © 1995 American Institute of Physics.  Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/71326/2/JAPIAU-78-6-3812-1.pd

Evolution of anisotropic microstructure and residual stress in sputtered Cr films

A series of Cr films with varying thicknesses have been prepared using a multiple moving substrate deposition geometry. These films have been investigated with several experimental techniques, including synchrotron x-ray scattering, pole figures, electron microscope, and double crystal diffraction topography. It was found that the in-plane stresses are highly anisotropic in these Cr films. The anisotropic stresses, characterized by two principal stresses in two characteristic directions defined by the deposition geometry, are quantified based on a methodology given in the Appendix. The plan view transmission electron microscopy observations reveal that the Cr films develop well-organized microstructures. The grains, which are elongated along the radial direction, are crystallographically aligned as well. The development of crystallographic texture in the Cr films, further revealed by pole figures and azimuthal (ϕ) x-ray scans, depends on both the deposition geometry and the film thickness. The preferential orientation of film growth is [110] for thinner films (<1.6 μm), and then becomes [111] for thicker films. Correspondingly, the in-plane texture varies in a conformal manner. In the former case, [100] and [110] directions of grains preferentially align along the radial direction and the direction of platen rotation, respectively. In the latter case, the preferential orientation of grains in the radial direction becomes [112], while that in the direction of rotation remains to be [110]. The occurrence of the anisotropic stresses and their dependence on film thickness is related to the evolution of the anisotropic structure and in-plane texture. The correlation is discussed in terms of the modulus effect associated with in-plane texture, the stress relief at intercolumnar voids, and the texture transition. © 2002 American Institute of Physics.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/69911/2/JAPIAU-92-12-7183-1.pd