7 research outputs found

    Optical properties of MgH2 measured in situ in a novel gas cell for ellipsometry/spectrophotometry

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    The dielectric properties of alpha-MgH2 are investigated in the photon energy range between 1 and 6.5 eV. For this purpose, a novel sample configuration and experimental setup are developed that allow both optical transmission and ellipsometric measurements of a transparent thin film in equilibrium with hydrogen. We show that alpha-MgH2 is a transparent, colour neutral insulator with a band gap of 5.6 +/- 0.1 eV. It has an intrinsic transparency of about 80% over the whole visible spectrum. The dielectric function found in this work confirms very recent band structure calculations using the GW approximation by Alford and Chou [J.A. Alford and M.Y. Chou (unpublished)]. As Pd is used as a cap layer we report also the optical properties of PdHx thin films.Comment: REVTeX4, 15 pages, 12 figures, 5 table

    Termites in Ecosystems

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    Probing surfaces with thermal He atoms: scattering and microscopy with a soft touch

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    Helium atom scattering (HAS) is a well established technique, particularly suited for the investigation of insulating and/or fragile materials and light adsorbates including hydrogen. In contrast to other beam techniques based on Xrays or electrons, low energy (typically less than 100 meV) He atoms are scattered by the tail of the electron density distribution which spill out from a surface, therefore HAS is strictly a nonpenetrating technique without any sample damage. HAS has been used to investigate structural properties of crystalline surfaces, including precise determination of atomic step heights, for monitoring thin film growth, to study surface transitions such as surface melting and roughening and for determining the presence and properties of adsorbates. Energy resolved HAS can provide information about surface vibrations (phonons) in the meV range and surface diffusion. This chapter provides a brief introduction to HAS with an outlook on a new, promising surface science technique: Neutral Helium Microscopy
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