1 research outputs found
Characterizing the surface charge of clay minerals with Atomic Force Microscope (AFM)
- Author
- Anandarajah A
- Anderson MT Lu N
- Barhoumi H Maaref A, Jaffrezic-Renault N
- Barisik M Atalay S, Beskok A, et al.
- Bayesteh H Mirghasemi AA
- Benna M Kbir-Ariguib N, Magnin A, et al.
- Bergstrom L
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- Dobryden I Potapova E, Holmgren A, et al.
- Drelich J Long J, Xu Z, et al.
- Firoozi AA Taha MR, Firoozi AA, et al.
- Garcia-Garcia S Jonsson M, Wold S
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- Gupta V Miller JD
- Hamaker HC
- Huang Q Wu H, Cai P, et al.
- Katti DR Matar MI, Katti KS, et al.
- Kretzschmar R Holthoff H, Sticher H
- Kumar N Zhao C, Klaassen A, et al.
- Liu J Gaikwad R, Hande A, et al.
- Liu J Sandaklie-Nikolova L, Wang X, et al.
- Lu N Anandarajah A
- Lu N Anderson MT, Likos WJ, et al.
- Ninham BW Parsegian VA
- Parsegian VA Gingell D
- Raiteri R Margesin B, Grattarola M
- Rodriguez K Araujo M
- Sokolov I Ong QK, Shodiev H, et al.
- Szabó T Wang J, Volodin A, et al.
- Veeramasuneni S Yalamanchili MR, Miller JD
- Zhang M Rong M, Zeng H, et al.
- Publication venue
- 'American Institute of Mathematical Sciences (AIMS)'
- Publication date
- 01/01/2017
- Field of study
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