45 research outputs found

    Warm Ionized Medium throughout the Sagittarius–Carina Arm

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    Wisconsin H-Alpha Mapper (WHAM) observations of H-Alpha and [S II]λ6716\lambda6716 emission are used to trace the vertical distribution and physical conditions of the warm ionized medium (WIM) along the Sagittarius-Carina arm. CO emission, tracing cold molecular gas in the plane of the Galaxy, is used as a guide to isolate H-Alpha and [S II] emission along individual spiral arms. Exponential scale heights of electron density squared (or emission measure) are determined using H-Alpha emission above (below) the midplane to be 330±80330 \pm 80 pc ( 550±230550 \pm 230 pc) along the near Sagittarius arm, 300±100300 \pm 100 pc (250±30250 \pm 30 pc) along the near Carina arm, and >1000>1000 pc along the far Carina arm. The emission measure scale height tends to increase as a function of Galactocentric radius along the Sagittarius-Carina arm for RG>8R_G > 8 kpc. Physical conditions of the ionized gas are analyzed using the [S II]/H-Alpha line ratio, which more closely traces H-Alpha Intensity than height above the plane, z, suggesting a stronger relationship with the in-situ electron density. We interpret this result as further evidence for the majority of the observed diffuse emission originating from in-situ ionized gas as opposed to scattered light from classical H II regions in the plane.Comment: 18 pages, 19 figures, 2 tables, accepted for publication in Ap

    Complex impedance measurements of calorimeters and bolometers: correction for stray impedances

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    Impedance measurements provide a useful probe of the physics of bolometers and calorimeters. We describe a method for measuring the complex impedance of these devices. In previous work, stray impedances and readout electronics of the measurement apparatus have resulted in artifacts in the impedance data. The new technique allows experimenters to find an independent Thevenin or Norton equivalent circuit for each frequency. This method allows experimenters to easily isolate the device impedance from the effects of parasitic impedances and frequency dependent gains in amplifiers.Comment: 5 pages, 6 figure
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