2 research outputs found
Aging of Transition Metal Dichalcogenide Monolayers
Two-dimensional
sheets of transition metal dichalcogenides are an emerging class of
atomically thin semiconductors that are considered to be “air-stable”,
similar to graphene. Here we report that, contrary to current understanding,
chemical vapor deposited transition metal dichalcogenide monolayers
exhibit poor long-term stability in air. After room-temperature exposure
to the environment for several months, monolayers of molybdenum disulfide
and tungsten disulfide undergo dramatic aging effects including extensive
cracking, changes in morphology, and severe quenching of the direct
gap photoluminescence. X-ray photoelectron and Auger electron spectroscopy
reveal that this effect is related to gradual oxidation along the
grain boundaries and the adsorption of organic contaminants. These
results highlight important challenges associated with the utilization
of transition metal dichalcogenide monolayers in electronic and optoelectronic
devices. We also demonstrate a potential solution to this problem,
featuring encapsulation of the monolayer sheet by a 10–20 nm
thick optically transparent polymer (parylene C). This strategy is
shown to successfully prevent the degradation of the monolayer material
under accelerated aging (<i>i</i>.<i>e</i>., high-temperature,
oxygen-rich) conditions
Low-Temperature Ohmic Contact to Monolayer MoS<sub>2</sub> by van der Waals Bonded Co/<i>h</i>‑BN Electrodes
Monolayer MoS<sub>2</sub>, among many other transition metal dichalcogenides, holds great
promise for future applications in nanoelectronics and optoelectronics
due to its ultrathin nature, flexibility, sizable band gap, and unique
spin-valley coupled physics. However, careful study of these properties
at low temperature has been hindered by an inability to achieve low-temperature
Ohmic contacts to monolayer MoS<sub>2</sub>, particularly at low carrier
densities. In this work, we report a new contact scheme that utilizes
cobalt (Co) with a monolayer of hexagonal boron nitride (h-BN) that
has the following two functions: modifies the work function of Co
and acts as a tunneling barrier. We measure a flat-band Schottky barrier
of 16 meV, which makes thin tunnel barriers upon doping the channels,
and thus achieve low-T contact resistance of 3 kΩ.μm at
a carrier density of 5.3 Ă— 10<sup>12</sup>/cm<sup>2</sup>. This
further allows us to observe Shubnikov–de Haas oscillations
in monolayer MoS<sub>2</sub> at much lower carrier densities compared
to previous work