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6 research outputs found

In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials

Author: B.W. Kempshall
L.A. Giannuzzi
Publication venue: 'Cambridge University Press (CUP)'
Publication date
Field of study

Characterization of Si in a W matrix Using Diffraction Contrast in the TEM

Author: B.I. Prenitzer
B.W. Kempshall
I. Wylie
J.M. McKinley
W.H. Stinebaugh
Publication venue: 'Cambridge University Press (CUP)'
Publication date
Field of study

Electron backscattering diffraction investigation of focused ion beam surfaces

Author: B. W. Kempshall
B.L. Adams
B.W. Kempshall
C.A. Urbanik
C.J. Harland
D.J. Dingley
Dale E. Newbury
David J. Dingley
David W. Susnitzky
E. C. Houge
F.A. Stevie
Joseph I. Goldstein
L. A. Giannuzzi
L.A. Giannuzzi
L.A. Giannuzzi
L.A. Giannuzzi
M. Nastasi
M. Nastasi
R.J. Young
S. W. Schwarz
T. L. Matteson
Publication venue: 'Springer Science and Business Media LLC'
Publication date
Field of study

A technique for improved focused ion beam milling of cryo-prepared life science specimens

Author: Burkhardt C.
Dubochet J.
Echlin P.
Elder H.
Heymann J.A.W.
Kempshall B.W.
Kishi R.
McLaughlin D.
Nijsse J.
Obst M.
Orloff J.
Osumi M.
Read N.
Sadanandom A.
Sargent J.
Sitte H.
Stokes D.
Umrath W.
van Duynhoven J.P.M.
Vartanian N.
Walther P.
Publication venue: 'Wiley'
Publication date
Field of study

Mapping residual stress distributions at the micron scale in amorphous materials

Author: A. Inoue
A. Turnbull
A.L. Greer
A.N. Guz
B.W. Kempshall
Bartlomiej Winiarski
C.C. Aydiner
C.C. Aydiner
C.C. Aydiner
D.C. Hofmann
F.O. Méar
G.Y. Wang
H. Tada
H.F. Poulsen
J. Das
J. Quinta De Fonseca
J.F. Ziegler
J.M. Pelletier
J.W. Tian
Jiawan Tian
K.J. Kang
K.J. Kang
L.Y. Chen
M. Nastasi
M.F. Ashby
N. Sabate
O.E. Kongstein
P.J. Withers
P.J. Withers
P.J. Withers
P.S. Steif
Peter K. Liaw
Philip J. Withers
R. Gardon
R. Raghavan
R.D. Conner
Richard M. Langford
S. Carlsson
S. Lipp
S. Massl
T.J. Kang
W.J. Arora
W.L. Johnson
X. Chen
Y. Zhang
Yoshihiko Yokoyama
Publication venue: 'Springer Science and Business Media LLC'
Publication date: 01/07/2010
Field of study

The University of Manchester - Institutional Repository

Mapping Residual Stress Distributions at the Micron Scale in Amorphous Materials

Author: A. Inoue
A. Turnbull
A.L. Greer
A.N. Guz
B.W. Kempshall
Bartlomiej Winiarski
C.C. Aydiner
C.C. Aydiner
C.C. Aydiner
D.C. Hofmann
F.O. Méar
G.Y. Wang
H. Tada
H.F. Poulsen
J. Das
J. Quinta De Fonseca
J.F. Ziegler
J.M. Pelletier
J.W. Tian
Jiawan Tian
K.J. Kang
K.J. Kang
L.Y. Chen
M. Nastasi
M.F. Ashby
N. Sabate
O.E. Kongstein
P.J. Withers
P.J. Withers
P.J. Withers
P.S. Steif
Peter K. Liaw
Philip J. Withers
R. Gardon
R. Raghavan
R.D. Conner
Richard M. Langford
S. Carlsson
S. Lipp
S. Massl
T.J. Kang
W.J. Arora
W.L. Johnson
X. Chen
Y. Zhang
Yoshihiko Yokoyama
Publication venue: 'Springer Science and Business Media LLC'
Publication date
Field of study

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