Electron beam diagnostics tool based on Cherenkov radiation in optical fibers

The results of experimental investigations of Cherenkov radiation in optical fibers with 0.6 mm thickness which were used to scan an electron beam of 5.7 MeV energy are presented. Using such a technique for beam profile measurements it is possible to create a compact and reliable device compared to existing systems based on ionization chambers

Estimation of the sensitivity in dual wave X-ray absorptiometry

Dual wave X-ray absorptiometry is considered theoretically and the application of suggested technique extends to the multiphase flow analysis. Proposed method allows for specifying dynamically the percentage of fluid components with the resolution as high as 0.25% (according to the mathematical simulating). The accuracy of this measurement is one order higher by magnitude than that provided by the state of the art flow analyzing devices

Influence of temperature gradient on diffracted X-ray spectrum in quartz crystal

In this work characteristics of hard X-ray (with energy higher than 30 keV) were investigated. In the experiment we measured spectra of X-ray reflected by a quartz monocrystal in Laue geometry under influence of the temperature gradient. The measurements were made by the spectrometer BDER-KI-11K with 300 eV resolution on the 17.74 keV spectral line of Am241 and the spectrometer XR-100CR with 270 eV resolution on the same spectral line. An existence of temperature gradient leads to increasing of the diffracted beam intensity. The intensity was measured dependently on the temperature of one of the edge of the crystal

Micron-scale vertical beam size measurements based on transition radiation imaging with a Schwarzschild objective

This report presents preliminary results of a measurement of a micron–scale vertical beam size based on imaging of optical transition radiation in the visible region. The visualization of point spread function dominated beam images was carried out using a Schwarzschild objective that provides high magnification and that is free of some of aberrations. According to the preliminary data treatment, a vertical rms beam size of 1.37 +- 0.07 micrometer was measured at the 855MeV beam of the Mainz Microtron MAMI (Germany)

On X-ray Source for Dual Wave Absorptiometry

A new method for the formation of a dual X-ray source spectrum for the method of analyzing multiphase fluid flow based on wave dispersive X-ray absorptiometry using crystalline monochromators is proposed. The experimental results of testing the proposed method of forming the optimal Xray spectrum are presented. A comparison with the results of numerical simulation is given