51 research outputs found

    Laser microsculpting for the generation of robust diffractive security markings on the surface of metals

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    AbstractWe report the development of a laser-based process for the direct writing (‘microsculpting’) of unique security markings (reflective phase holograms) on the surface of metals. In contrast to the common approaches used for unique marking of the metal products and components, e.g., polymer holographic stickers which are attached to metals as an adhesive tape, our process enables the generation of the security markings directly onto the metal surface and thus overcomes the problems with tampering and biocompatibility which are typical drawbacks of holographic stickers. The process uses 35ns laser pulses of wavelength 355nm to generate optically-smooth deformations on the metal surface using a localised laser melting process. Security markings (holographic structures) on 304-grade stainless steel surface are fabricated, and their resulted optical performance is tested using a He–Ne laser beam of 632.8nm wavelength

    Lithium Niobate (LiNbO3) Waveguides for Electromagnetic Pulse (EMP) Sensing

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    Non-destructive thickness measurement of thermal barrier coatings using terahertz radiation

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    A non-destructive thickness measurement technique based on terahertz (THz) reflectivity was successfully deployed to interrogate 7 wt.% yttria-stabilised zirconia thermal barrier coatings (TBCs) produced by electron-beam physical vapour deposition (EB-PVD). The THz technique was shown to produce accurate thickness maps for different samples with a resolution of 1 × 1 mm over a surface of 65 × 20 mm that were compared with direct examination of key cross-sections. All thickness measurements on different samples were calculated using a single value of refractive index. Small defects characteristic of EB-PVD, such as “carrot growths” and variations on column inclination, were evaluated and did not produce significant variations in the refractive index of the TBC. Moreover, the thickness maps correctly display thickness variations that are a consequence of the point-source nature of EB-PVD evaporation. In summary, this paper demonstrates the technique can be successfully deployed on large surfaces, and across different coatings of the same material produced under the same deposition conditions. It is shown that a single n value is required to map the thickness distribution for all samples. This combination of qualities indicates the potential of the technique for in-line control of TBC manufacture

    Demonstrating a bright future

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    Optoelectronic radial basis function network training techniques

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    VCSEL operational requirements for optoelectronic neural networks

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