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2 research outputs found
Effect of thermal shock conditions on reliability of chip ceramic capacitors
Author
Alexander A Teverovsky@nasa Gov
Alexander Teverovsky
Publication venue
Publication date
11/04/2020
Field of study
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Abstrac
CiteSeerX
Effect of Reverse Bias Stress on Leakage Currents and Breakdown Voltages of Solid Tantalum Capacitors
Author
Alexander A Teverovsky@nasa Gov
Alexander Teverovsky
Publication venue
Publication date
23/04/2020
Field of study
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CiteSeerX
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