Identifying and Explaining Safety-critical Scenarios for Autonomous Vehicles via Key Features

Ensuring the safety of autonomous vehicles (AVs) is of utmost importance and testing them in simulated environments is a safer option than conducting in-field operational tests. However, generating an exhaustive test suite to identify critical test scenarios is computationally expensive as the representation of each test is complex and contains various dynamic and static features, such as the AV under test, road participants (vehicles, pedestrians, and static obstacles), environmental factors (weather and light), and the road's structural features (lanes, turns, road speed, etc.). In this paper, we present a systematic technique that uses Instance Space Analysis (ISA) to identify the significant features of test scenarios that affect their ability to reveal the unsafe behaviour of AVs. ISA identifies the features that best differentiate safety-critical scenarios from normal driving and visualises the impact of these features on test scenario outcomes (safe/unsafe) in 2D. This visualization helps to identify untested regions of the instance space and provides an indicator of the quality of the test suite in terms of the percentage of feature space covered by testing. To test the predictive ability of the identified features, we train five Machine Learning classifiers to classify test scenarios as safe or unsafe. The high precision, recall, and F1 scores indicate that our proposed approach is effective in predicting the outcome of a test scenario without executing it and can be used for test generation, selection, and prioritization.Comment: 28 pages, 6 figure

Towards Reliable AI: Adequacy Metrics for Ensuring the Quality of System-level Testing of Autonomous Vehicles

AI-powered systems have gained widespread popularity in various domains, including Autonomous Vehicles (AVs). However, ensuring their reliability and safety is challenging due to their complex nature. Conventional test adequacy metrics, designed to evaluate the effectiveness of traditional software testing, are often insufficient or impractical for these systems. White-box metrics, which are specifically designed for these systems, leverage neuron coverage information. These coverage metrics necessitate access to the underlying AI model and training data, which may not always be available. Furthermore, the existing adequacy metrics exhibit weak correlations with the ability to detect faults in the generated test suite, creating a gap that we aim to bridge in this study. In this paper, we introduce a set of black-box test adequacy metrics called "Test suite Instance Space Adequacy" (TISA) metrics, which can be used to gauge the effectiveness of a test suite. The TISA metrics offer a way to assess both the diversity and coverage of the test suite and the range of bugs detected during testing. Additionally, we introduce a framework that permits testers to visualise the diversity and coverage of the test suite in a two-dimensional space, facilitating the identification of areas that require improvement. We evaluate the efficacy of the TISA metrics by examining their correlation with the number of bugs detected in system-level simulation testing of AVs. A strong correlation, coupled with the short computation time, indicates their effectiveness and efficiency in estimating the adequacy of testing AVs.Comment: 12 pages, 7 figure

Closing the Loop for Software Remodularisation -- REARRANGE: An Effort Estimation Approach for Software Clustering-based Remodularisation

Software remodularization through clustering is a common practice to improve internal software quality. However, the true benefit of software clustering is only realized if developers follow through with the recommended refactoring suggestions, which can be complex and time-consuming. Simply producing clustering results is not enough to realize the benefits of remodularization. For the recommended refactoring operations to have an impact, developers must follow through with them. However, this is often a difficult task due to certain refactoring operations' complexity and time-consuming nature.Comment: Accepted for publication at ICSE23 Poster Trac

Test-based Patch Clustering for Automatically-Generated Patches Assessment

Previous studies have shown that Automated Program Repair (APR) techniques suffer from the overfitting problem. Overfitting happens when a patch is run and the test suite does not reveal any error, but the patch actually does not fix the underlying bug or it introduces a new defect that is not covered by the test suite. Therefore, the patches generated by APR tools need to be validated by human programmers, which can be very costly, and prevents APR tools adoption in practice.Our work aims at increasing developer trust in automated patch generation by minimizing the number of plausible patches that they have to review, thereby reducing the time required to find a correct patch. We introduce a novel light-weight test-based patch clustering approach called xTestCluster, which clusters patches based on their dynamic behavior. xTestCluster is applied after the patch generation phase in order to analyze the generated patches from one or more repair tools. The novelty of xTestCluster lies in using information from execution of newly generated test cases to cluster patches generated by multiple APR approaches. A cluster is formed with patches that fail on the same generated test cases. The output from xTestCluster gives developers a) a way of reducing the number of patches to analyze, as they can focus on analyzing a sample of patches from each cluster, b) additional information attached to each patch. After analyzing 1910 plausible patches from 25 Java APR tools, our results show that xTestCluster is able to reduce the number of patches to review and analyze with a median of 50%. xTestCluster can save a significant amount of time for developers that have to review the multitude of patches generated by APR tools, and provides them with new test cases that show the differences in behavior between generated patches