Search CORE

3 research outputs found

Dynamics Analysis of Single Shockley Stacking Fault Expansion in 4H-SiC P-i-N Diode Based on Free Energy

Author: Akihiro Goryu
Akira Kano
Aoi Okada
Chiharu Ota
Johji Nishio
Kenji Hirohata
Mitsuaki Kato
Publication venue: 'Trans Tech Publications, Ltd.'
Publication date
Field of study

Evaluation of Effect of Mechanical Stress on Stacking Fault Expansion in 4H-SiC P-i-N Diode

Author: Akihiro Goryu
Akira Kano
Aoi Okada
Chiharu Ota
Johji Nishio
Kenji Hirohata
Mitsuaki Kato
Satoshi Izumi
Publication venue: 'Trans Tech Publications, Ltd.'
Publication date
Field of study

Initiation of Shockley Stacking Fault Expansion in 4H-SiC P-i-N Diodes

Author: Akihiro Goryu
Aoi Okada
Chiharu Ota
Hajime Okumura
Johji Nishio
Koji Nakayama
Ryosuke Iijima
Tomohisa Kato
Yoshiyuki Yonezawa
Publication venue: 'Trans Tech Publications, Ltd.'
Publication date
Field of study

core

core