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4 research outputs found

Modeling of Bias Dependent Fluctuations of Flicker Noise of MOSFETs

Author: A Hajimiri
Avd Ziel
KK Hung
MJM Pelgrom
PK Ko
PR Gray
Publication venue: 'Springer Science and Business Media LLC'
Publication date: 01/01/2001
Field of study

Implementation-Based Design Fingerprinting for Robust IC Fraud Detection

Author: A Singh
AVD Ziel
C Celio
C Guerin
CW Hsu
DB Roy
Farinaz Koushanfar
G Qu
GB Huang
J Cong
J He
K Huang
KK Hung
M Rostami
M Tehranipoor
N Karimi
N Karimi
RS Chakraborty
S Kadiyala Rao
S Koteshwara
U Guin
Z Guo
Publication venue: 'Springer Science and Business Media LLC'
Publication date
Field of study

Low Frequency Noise Analysis of Single Gate Extended Source Tunnel FET

Author: AM Ionescu
AP Van Der Wel
AVD Ziel
B Das
C Claeys
F Ga’miz
FN Hooge
FS Neves
GE Moore
Gopal Rawat
J Talukdar
J Talukdar
J Wan
J Xu
Jagritee Talukdar
K Boucart
Kavicharan Mummaneni
Kunal Singh
M Hellenbrand
MV Haartman
R Goswami
R Goswami
R Pandey
TCAD
TV Singh
W Wang
X Zhou
Publication venue: 'Springer Science and Business Media LLC'
Publication date
Field of study

A flexible and wearable terahertz scanner

Author: A Bravin
AVD Ziel
B Ferguson
BC St-Antoine
CM Ciesla
D Spirito
D. Suzuki
E Pickwell
HB Michaelson
HM Manohana
J Hone
JP Guillet
K Kawase
K Kobashi
KJ Erikson
L Vicarelli
M Lee
M Rinzan
M Tonouchi
MC Kemp
ME Itkis
N Oda
R Han
S. Oda
SL Chen
SR Tripathi
T Otsuji
X Cai
X He
X He
Y Kawano
Y Kawano
Y Kawano
Y. Kawano
Publication venue: 'Springer Science and Business Media LLC'
Publication date
Field of study

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