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2 research outputs found
Metallurgical topics in silicon device interconnections: Thin film stresses
Author
AMELINCKX VANHELLEMONT S.
BLECH I. A.
+12Â more
BOMCHIL G.
BRAVMAN J. C.
BURGRAAF P.
d'HEURLE F. M.
DENNARD R. H.
F. M. d'Heurle
GARDNER D. S.
K
KLOKHOLM E.
PEERCY P. S.
SACHDEV S.
SCHWABE U.
Publication venue
'Maney Publishing'
Publication date
Field of study
No full text
Crossref
HREM investigation of twinning in very high dose phosphorus ion-implanted silicon
Author
A. Bourret
A. Veirman
+24Â more
A.G. Cullis
C. Boulesteix
D. Dyck Van
D.W. Pashley
H. Bender
H. Oppolzer
J. Landuyt
J. Narayan
J. Narayan
J. Vanhellemont
J. Vanhellemont
J. Washburn
J.L. Hutchison
M. Hendriks
M. Wittmer
P. Revesz
R. Drosd
S. Amelinckx
T.Y. Tan
V.G. Eremenko
W. Coene
W. Coene
W. Coene
Y. Lereah
Publication venue
'Springer Science and Business Media LLC'
Publication date
Field of study
No full text
Crossref