EBSD characterization of cryogenically rolled type 321 austenitic stainless steel

Electron backscatter diffraction was applied to investigate microstructure evolution during cryogenic rolling of type 321 metastable austenitic stainless steel. As expected, rolling promoted deformation-induced martensitic transformation which developed preferentially in deformation bands. Because a large fraction of the imposed strain was accommodated by deformation banding, grain refinement in the parent austenite phase was minimal. The martensitic transformation was found to follow a general orientation relationship, {111}γ||{0001}ε||{110}α′ and 〈110〉γ||〈11-20〉ε||〈111〉α′, and was characterized by noticeable variant selection

Martensite-to-austenite reversion and recrystallization in cryogenically-rolled type 321 metastable austenitic steel

The annealing behavior of cryogenically-rolled type 321 metastable austenitic steel was established. Cryogenic deformation gave rise to martensitic transformation which developed preferentially within deformation bands. Subsequent annealing in the range of 600 C to 700 C resulted in reversion of the strain-induced martensite to austenite. At 800 C, the reversion was followed by static recrystallization. At relatively-low temperatures, the reversion was characterized by a very strong variant selection, which led to the restoration of the crystallographic orientation of the coarse parent austenite grains. An increase in the annealing temperature relaxed the variant-selection tendency and provided subsequent recrystallization thus leading to significant grain refinement. Nevertheless, a significant portion of the original coarse grains was found to be untransformed and therefore the fine-grain structure was fairly heterogeneous

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Diagnosis in hybrid fault situations under aim and a unified t-characterization theorem

AbstractThis paper characterizes th/thi-diagnosable systems and ti-diagnosable system under the asymmetric invalidation model (AIM) in the presence of hybrid and intermittent faults. This completes the missing part in the theory of t-diagnosability under the most used models, i.e. the symmetric and the asymmetric invalidation models with and without the presence of intermittent faults. A unified t-characterization theorem is also presented in this paper which unites the t-characterization theorems under these models into a single theorem. The diagnosability and diagnosis algorithm for th/thi-diagnosable and ti-diagnosable systems under the AIM are also presented

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Efficient algorithms for routing dependable connections in WDM optical networks

10.1109/90.958325IEEE/ACM Transactions on Networking95553-566IEAN