2 research outputs found
silicon carbide (SiC), impurities and defect levels, general
- Author
- A.G. Zubatov
- A.G. Zubatov
- A.v. Duijn-Arnold
- B.I. Shklovskii
- D.J. Larkin
- D.M. Caughey
- G. Pensl
- G. Pensl
- G. Rutsch
- G. Wellenhofer
- G.L. Pearson
- H. Itoh
- H. Morkoç
- H.H. Woodbury
- J. Baur
- K. Abe
- K. Tone
- K.F. Dombrowski
- K.M. Lee
- L. Patrick
- M. März
- M. Schadt
- M.V. Alekseenko
- N. Lien Van
- O. Takemura
- P.G. Baranov
- P.P. Debye
- R. Müller
- R.A. Faulkner
- R.F. Davis
- S. Dang Le
- S. Greulich-Weber
- S. Greulich-Weber
- T. Dalibor
- T. Frank
- T. Kimoto
- T. Troffer
- T. Troffer
- T.F. Lee
- W. Götz
- W. Kohn
- W. Suttrop
- W.J. Choyke
- W.J. Schaffer
- Y. Tanaka
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- 01/01/2003
- Field of study
Shallow acceptor levels in 4H- and 6H-SiC
- Author
- A. O. Evwaraye
- A.G. Zubatov
- A.O. Evwaraye
- A.O. Evwaraye
- A.O. Evwaraye
- A.O. Evwaraye
- A.O. Evwaraye
- C. Raynaud
- D.L. Losee
- G. Pensl
- G.A. Lomakina
- G.E.G. Hendeman
- H.H. Woodbury
- Lambrecht
- M. A. Capano
- M. Ikeda
- M.M. Anikin
- Matsumoto
- S. Dueñas
- S. R. Smith
- S.R. Smith
- T. Kimoto
- W. C. Mitchel
- W. Götz
- W. Suttrop
- W. Suttrop
- W.C. Mitchel
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- Field of study