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Deformation-Induced Grain Refinement and Amorphization in Ti-10V-2Fe-3Al Alloy
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- 'Springer Science and Business Media LLC'
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No full textMechanische Eigenschaften
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- A. Abel
- A. Abel
- A. Balasundaram
- A. Deschamps
- A. Deschamps
- A. Gilat
- A. Korbel
- A. Korbel
- A. Needleman
- A. Needleman
- A. Portevin
- A. Somoza
- A. Turnbull
- A. Turnbull
- A.G. Considère
- A.H. Clausen
- A.S. Khan
- A.S. Tetelmann
- A.T. Zehnder
- A.W. Thompson
- Annon.
- C. Bathias
- C. Déprés
- C. Heller
- C. Kramer
- C. Laird
- C. Morgenstern
- C.-K. Lin
- C.A. Stubbington
- C.H. Karnes
- C.M. Sonsino
- C.M. Sonsino
- C.M. Sonsino
- C.M. Sonsino
- D. Banabic
- D. Dumont
- D. Gross
- D. Jiang
- D. Jíša
- D. Kosteas
- D. Teirlinck
- D. Walgraef
- D.E. Green
- D.H. Avery
- D.M. Jiang
- D.P. Rooke
- DVS 1608-2011-09
- DVS 2401
- E. Doege
- E. El-Magd
- E. Haibach
- E. Hornbogen
- E. Maire
- E. Voce
- E.A. Starke Jr.
- F. Barlat
- F. Barlat
- F. Bergner
- F. Bron
- F. Ostermann
- F.A. McClintock
- FKM 2006
- G. Liu
- G. Liu
- G. Scharf
- G. Valtinat
- G. Venkataraman
- G.C. Kaschner
- G.E. Dieter Jr.
- G.R. Irwin
- H. Aretz
- H. Bühler
- H. Engström
- H. Hooputra
- H. Mughrabi
- H. Nielsen
- H. Stroppe
- H. Stroppe
- H. Takuda
- H.A. Richard
- H.A. Richard
- H.A. Richard
- H.H. Blumenauer
- H.M. Westergaard
- H.N. Han
- I. Sattari-Far
- I.J. Polmear
- J. Chicois
- J. Lindigkeit
- J. McKittrick
- J. Sarkar
- J. Sarkar
- J. Zhou
- J.B. Clark
- J.C. Newman
- J.C. Newman Jr.
- J.D. Campbell
- J.G. Blauel
- J.G. Blauel
- J.G. Kaufman
- J.M. Duva
- J.R. Rice
- J.S. Robinson
- J.T. Staley
- J.W. Hutchinson
- JD Morrow
- K. Angermayer
- K. Pedersen
- K. Raviprasad
- K. Sadananda
- K. Wallin
- K. Wellinger
- K.-H. Schwalbe
- K.C. Kim
- K.H. Schwalbe
- K.J. Miller
- K.N. Smith
- K.S. Chan
- K.U Snowden
- L Mori
- L. Hodulak
- L. Xue
- L.D. Oosterkamp
- L.F. Coffin Jr.
- L.M Cheng
- M. Baur
- M. Brochu
- M. Brochu
- M. Gologano
- M. Jain
- M. Nakai
- M. Shatla
- M. Wagenhofer
- M.A. Fonte
- M.A. Kassem
- M.A. Meggiolaro
- M.D. Halliday
- M.E. Kassner
- M.H. Raymond
- M.L. Williams
- N. Ryum
- N. Ryum
- P. Franciosi
- P. Haasen
- P. Ludwik
- P.C. Paris
- P.H. Huppertz
- P.W. Bridgman
- R. Develay
- R. Hill
- R. Hill
- R. Hill
- R. Sandström
- R. Sandström
- R.D. Carter
- R.E. Zinkham
- R.J. Durham
- R.N. Lumley
- R.N. Lumley
- R.N. Lumley
- R.N. Lumley
- R.N. Lumley
- R.W. Landgraf
- S. Pantelakis
- S.J. Green
- S.N. Rashkeev
- S.P. Keeler
- T Shikama
- T. Endo
- T. Naka
- T. Pardoen
- T. Shikama
- T. Wierzbicki
- T. Zhai
- T. Zhai
- T.B. Stoughton
- T.H. Topper
- U. Eßmann
- U. Zerbst
- V. Tvergaard
- W Egger
- W. Böhme
- W. Schütz
- W.-S. Lee
- W.A. Backofen
- W.J. Plumbridge
- W.L. Morris
- W.M. Webernig
- Y. Abe
- Y. Bao
- Y. El-Madhoun
- Y.X. Gao
- Y.X. Gao
- Z.S. Basinski
- Publication venue
- 'Springer Science and Business Media LLC'
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