6 research outputs found

    ab-plane tunneling and Andreev spectroscopy of superconducting gap and pseudogap in (Bi,Pb)2Sr2Ca2Cu3O10 and Bi2Sr2CaCu2O8

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    We have measured the temperature dependence of gap features revealed by Andreev reflection Delta_s and by tunneling Delta in the ab-plane of optimal and slightly overdoped microcrystals of (BiPb)2Sr2Ca2Cu3O10 (Bi2223) with critical temperature Tc=110-115 K, and Bi2Sr2CaCu2O8 (Bi2212) with Tc=80-84 K. The tunneling conductance of Bi2223-Insulator-Bi2223 junction shows peaks at the 2Delta gap voltage, as well as dips and broad humps at other voltages. In Bi2223, similarly to the well known Bi2212 spectra, the energies corresponding to 2Delta, to the dip, and to the hump structure are in the ratio of 2:3:4. This confirms that the dip and hump features are generic to the high temperature superconductors, irrespective of the number of CuO2 layers or the BiO superstructure. On the other hand, in both compounds Delta(T) and Delta_s(T) dependences are completely different, and we conclude that the two entities have different nature.Comment: LaTeX 2e, 17 pages, 7 figures in .eps forma

    Strong Pinning in High Temperature Superconductors

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    Detailed measurements of the critical current density jc of YBa2Cu3O7 films grown by pulsed laser deposition reveal the increase of jc as function of the filmthickness. Both this thickness dependence and the field dependence of the critical current are consistently described using a generalization of the theory of strong pinning of Ovchinnikov and Ivlev [Phys. Rev. B 43, 8024 (1991)]. From the model, we deduce values of the defect density (10^21 m^-3) and the elementary pinning force, which are in good agreement with the generally accepted values for Y2O3-inclusions. In the absence of clear evidence that the critical current is determined by linear defects or modulations of the film thickness, our model provides an alternative explanation for the rather universal field dependence of the critical current density found in YBa2Cu3O7 films deposited by different methods.Comment: 11 pages; 8 Figures; Published Phys. Rev. B 66, 024523 (2002
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