21 research outputs found
A method for measuring the shape of a surface of an ellipsoid of rotation on a Talysurf CCI 2000 interference microscope
Spectroscopic and ion probe characterization of laser produced plasmas used for thin film growth
X-ray waveguide structures of thin metal-carbon layers
X-ray waveguide structures consisting of two ultra-thin metal layers with a carbon layer in between them deposited on glass substrate are investigated. The reflectivity as well as fluorescence yield from the different metal layers, are used to elucidate the role of the various layers comprising the structure.
The detailed -field intensity distribution inside and above the layers is presented