160 research outputs found

    Mapping the conformations of biological assemblies

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    Mapping conformational heterogeneity of macromolecules presents a formidable challenge to X-ray crystallography and cryo-electron microscopy, which often presume its absence. This has severely limited our knowledge of the conformations assumed by biological systems and their role in biological function, even though they are known to be important. We propose a new approach to determining to high resolution the three-dimensional conformations of biological entities such as molecules, macromolecular assemblies, and ultimately cells, with existing and emerging experimental techniques. This approach may also enable one to circumvent current limits due to radiation damage and solution purification.Comment: 14 pages, 6 figure

    The activation energy for GaAs/AlGaAs interdiffusion

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    Copyright 1997 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. This article appeared in Journal of Applied Physics 82, 4842 (1997) and may be found at

    Direct evidence for a piezoelectriclike effect in coherently strained SiGe/Si heterostructures

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    A hybrid acoustic spectroscopy technique has been used to demonstrate the (reversible) conversion of high frequency electric fields into longitudinal acoustic waves within a modulation-doped pseudomorphic Si/Si0.88Ge0.12/Si heterostructure. This provides compelling evidence for the existence of a piezoelectriclike coupling within such structures

    Structure and energetics of the Si-SiO_2 interface

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    Silicon has long been synonymous with semiconductor technology. This unique role is due largely to the remarkable properties of the Si-SiO_2 interface, especially the (001)-oriented interface used in most devices. Although Si is crystalline and the oxide is amorphous, the interface is essentially perfect, with an extremely low density of dangling bonds or other electrically active defects. With the continual decrease of device size, the nanoscale structure of the silicon/oxide interface becomes more and more important. Yet despite its essential role, the atomic structure of this interface is still unclear. Using a novel Monte Carlo approach, we identify low-energy structures for the interface. The optimal structure found consists of Si-O-Si "bridges" ordered in a stripe pattern, with very low energy. This structure explains several puzzling experimental observations.Comment: LaTex file with 4 figures in GIF forma

    Deep electronic states in ion-implanted Si

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    In this paper we present an overview of the deep states present after ion-implantation by various species into n-type silicon, measured by Deep Level Transient Spectroscopy (DLTS) and high resolution Laplace DLTS (LDLTS). Both point and small extended defects are found, prior to any anneal, which can therefore be the precursors to more detrimental defects such as end of range loops. We show that the ion mass is linked to the concentrations of defects that are observed, and the presence of small interstitial clusters directly after ion implantation is established by comparing their behaviour with that of electrically active stacking faults. Finally, future applications of the LDLTS technique to ion-implanted regions in Si-based devices are outlined.</p

    Coherent diffraction of single Rice Dwarf virus particles using hard X-rays at the Linac Coherent Light Source

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    Single particle diffractive imaging data from Rice Dwarf Virus (RDV) were recorded using the Coherent X-ray Imaging (CXI) instrument at the Linac Coherent Light Source (LCLS). RDV was chosen as it is a wellcharacterized model system, useful for proof-of-principle experiments, system optimization and algorithm development. RDV, an icosahedral virus of about 70 nm in diameter, was aerosolized and injected into the approximately 0.1 mu m diameter focused hard X-ray beam at the CXI instrument of LCLS. Diffraction patterns from RDV with signal to 5.9 angstrom ngstrom were recorded. The diffraction data are available through the Coherent X-ray Imaging Data Bank (CXIDB) as a resource for algorithm development, the contents of which are described here.11Ysciescopu
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