SHORT RANGE ORDER IN ANNEALED FexSi1-x AMORPHOUS FILMS

Magnetic properties of as-prepared (sputtered) and annealed FexSi1-x (0.64 ≤ x ≤ 0.78) amorphous films deposited at room temperature, are interpreted in terms of chemical short-range order and compared with evaporated films deposited at 77 K. Low temperature (≤ 30 K) magnetization behaviour follows ; M (T) / M (0) = 1 - BT3/2 - CT5/2 with B = 1.5 x 10-2 K-3/2 ; C = -2.610 x-4 K-5/2. Related spin wave stiffness constant is D = 0.9 meV Å2