Wideband Electrical Characterization Of Materials Used In Mcm Applications

The objective of this work is to conduct a comprehensive wideband electrical evaluation of materials and technologies used in multichip module fabrication. This paper presents a set of technics which can be used to assess the MCM technologies\u27 electrical properties. As an illustration of this approach, an electrical comparison is made between laminate MCM (MCM-L) and ceramic MCM (MCM-C) technologies. In addition, a number of materials and fabrication technologies have been examined in order to compare the potential performance and to outline the range of viable applications for each material system and technology. This paper also describes a unique and novel resonant structure used to evaluate the electromagnetic properties of a number of electronic materials and technologies

Systematic Optimization Technique for MESFET

Accurate small and large-signal models of metal-semiconductor field effect transistor (MESFET) devices are essential in all modern microwave and millimeter wave applications. Those models are used for robust designs and fabrication development. The sophistication of modern communication systems urged the need of monolithic microwave integrated circuits (MMICs), which consists of many MESFETs on the same chip. As the chip density increases, the need of accurate MESFET models becomes more pronounced