An X-ary diffraction study on the elastic constants and residual stresses

Maste

Theoretical Detection Limits of Sychrotron Radiation Excited Total Reflection X-ray Flourescence Analysis for Silicon Wafers

Docto

Structural study on the ferroelectric transition in magnetoelectric YMnO3

1

방사광을 이용한 전반사 형광 X-선 분석시 실리콘 웨이퍼의 결정방향에 대한 배경강도 의존성 연구

2