17 research outputs found
์ ์ ๊ธฐ์๋ ฅํ ์ธ์๋ฅผ ํ์ฉํ ๋จ์ผ๋ฒฝ ํ์๋๋ ธํ๋ธ ๊ธฐ๋ฐ ํธ๋์ง์คํฐ ๋ฐ ์์ฉ
ํ์๋
ผ๋ฌธ (๋ฐ์ฌ) -- ์์ธ๋ํ๊ต ๋ํ์ : ๊ณต๊ณผ๋ํ ์ ๊ธฐยท์ปดํจํฐ๊ณตํ๋ถ, 2020. 8. ํ์ฉํ.As the demand and research for electronic devices on flexible and stretchable substrates gradually continues comparable to the conventional rigid silicon-based electronic devices, interest in new semiconducting materials capable of low-temperature processes and large-area processes is increasing. Single-walled carbon nanotube (SWCNT) is one of the representative materials satisfying the new interests thanks to its excellent electrical and mechanical properties. SWCNT can be advantageous for non-vacuum, low-temperature, and large-area processes in response to various solution processes such as dipping, inkjet printing, and gravure printing. For high-performance devices with low power consumption based on next-generation electronics, the demand for ultra-fine patterning technology based on the solution process is also increasing.
In this thesis, SWCNT-based all electrohydrodynamic-jet (E-jet) printing system was established, a SWCNT-based thin-film transistor (SWCNT-TFT) with a channel length of 5 microns was implemented through the system. In addition, by developing and grafting technology to control the threshold voltage of SWCNT-TFTs based on the solution process, we have demonstrated highly integrated and high-resolution SWCNT-based applications including logic gate, pixel circuits for image detector and display. In addition to the micrometer scale fine pattern technology by the E-jet printing system, a new solution process-based vertical stacking technology is also introduced to further improve the transistor density, enabling high-resolution, highly integrated electronic applications in a continuous environment without any vacuum or high temperature process. The technology introduced in this thesis for high performance, high resolution, and high integration of SWCNT-based devices makes it possible to fabricate a 250 pixel per inch active matrix backplane utilizing only the solution process.์ ์ฐ ๊ธฐํ ๋ฐ ์ ์ถ์ฑ ๊ธฐํ์์ ์ ์ ์์์ ๋ํ ์์ ๋ฐ ์ฐ๊ตฌ๊ฐ ์ข
๋์ ๋จ๋จํ ์ค๋ฆฌ์ฝ ๊ธฐ๋ฐ์ ์ ์ ๊ธฐ์ ๋งํผ์ด๋ ๋ง์ ๊ด์ฌ์ ๋ฐ๊ณ ์์ด, ์ด๋ฅผ ์ํ ์ ์จ ๊ณต์ ๋ฐ ๋๋ฉด์ ๊ณต์ ์ด ๊ฐ๋ฅํ ์๋ก์ด ๋ฐ๋์ฒด ๋ฌผ์ง ์ฐ๊ตฌ์ ๋ํ ๊ด์ฌ์ด ์ฆ๊ฐํ๊ณ ์๋ค. ๋จ์ผ๋ฒฝ ํ์๋๋
ธํ๋ธ๋ ๋ฐ์ด๋ ์ ๊ธฐ์ ๋ฐ ๊ธฐ๊ณ์ ํน์ฑ ๋ฟ๋ง ์๋๋ผ ๋น ์ง๊ณต, ์ ์จ, ๊ทธ๋ฆฌ๊ณ ๋๋ฉด์ ๊ณต์ ์ด ๊ฐ๋ฅํ ๋ด๊ธ ๊ณต์ , ์ํฌ์ ฏ ํ๋ฆฐํ
, ๊ทธ๋ฆฌ๊ณ ๊ทธ๋ผ๋น์ ์ธ์๋ฒ๊ณผ ๊ฐ์ ์ฉ์ก๊ณต์ ์ ๋์ํ๊ธฐ์ ์ด๋ฌํ ์๊ตฌ๋ฅผ ์ถฉ๋ถํ ์ถฉ์กฑ์ํจ๋ค. ๋ง์ฐฌ๊ฐ์ง๋ก ์ฉ์ก ๊ณต์ ๊ธฐ๋ฐ ์์์ ๊ณ ์ฑ๋ฅ ๋ฐ ์ ์ ๋ ฅํ๋ฅผ ์ํ ์ฉ์ก ๊ณต์ ๊ธฐ๋ฐ์ ์ด ๋ฏธ์ธ ํจํฐ๋ ๊ธฐ์ ์ ๋ํ ํ์์ฑ๋ ์ฆ๊ฐํ๊ณ ์๋ค.
๋ณธ ํ์ ๋
ผ๋ฌธ์์๋ ๋จ์ผ๋ฒฝ ํ์๋๋
ธํ๋ธ ๊ธฐ๋ฐ์ ์ ์ ์ ๊ธฐ์๋ ฅํ ์ธ์ ์์คํ
์ ๊ตฌ์ถํ์ฌ 5๋ง์ดํฌ๋ก ์ ์ฑ๋ ๊ธธ์ด๋ฅผ ๊ฐ๋ ๋จ์ผ๋ฒฝ ํ์๋๋
ธํ๋ธ ๊ธฐ๋ฐ ๋ฐ๋งํธ๋์ง์คํฐ๋ฅผ ๊ตฌํํ์๋ค. ๋ํ ์ฉ์ก ๊ณต์ ๊ธฐ๋ฐ์ ๋จ์ผ๋ฒฝ ํ์๋๋
ธํ๋ธ ๊ธฐ๋ฐ ๋ฐ๋งํธ๋์ง์คํฐ์ ๋ฌธํฑ ์ ์์ ์กฐ์ ํ๋ ๊ธฐ์ ์ ๊ฐ๋ฐํ๊ณ ์ด๋ฅผ ์ ๋ชฉ์์ผ ๋
ผ๋ฆฌ์์์ ์์์ผ์ ๋ฐ ๋์คํ๋ ์ด๋ฅผ ์ํ ํฝ์
ํ๋ก๋ฅผ ํฌํจํ ๋จ์ผ๋ฒฝ ํ์๋๋
ธํ๋ธ ๊ธฐ๋ฐ์ ๊ณ ํด์๋, ๊ณ ์ง์ ํ๋ ์์ฉ์์๋ฅผ ๊ฐ๋ฐํ์๋ค. ์ ์ ๊ธฐ์๋ ฅํ ์ธ์ ์์คํ
์ ํตํ ๋ง์ดํฌ๋ก ์์ค์ ๋ฏธ์ธ ํจํฐ๋ ๊ธฐ์ ๋ฟ๋ง ์๋๋ผ ์ง์ ๋๋ฅผ ๋์ฑ ํฅ์์ํค๊ธฐ ์ํ ์ฉ์ก ๊ณต์ ๊ธฐ๋ฐ์ ์๋ก์ด ์์ง ์ ์ธตํ ๊ธฐ์ ์ ๋์
ํ์ฌ ๊ณ ํด์๋ ๋ฐ ๊ณ ์ง์ ํ๋ ๋จ์ผ๋ฒฝ ํ์๋๋
ธํ๋ธ ๊ธฐ๋ฐ์ ์ ์ ์์๋ฅผ ์ด๋ ํ ์ง๊ณต ๊ณต์ ์ด๋ ๊ณ ์จ๊ณต์ ์์ด ์ฐ์๋ ํ๊ฒฝ์์ ๊ตฌํํ์๋ค. ๋ณธ ํ์๋
ผ๋ฌธ์์ ์ ์ํ ๋จ์ผ๋ฒฝ ํ์๋๋
ธํ๋ธ ๊ธฐ๋ฐ ์์์ ๊ณ ์ฑ๋ฅ, ๊ณ ํด์๋, ๊ณ ์ง์ ํ๋ฅผ ์ํ ๊ธฐ์ ์ 250 ppi๊ธ์ ๋ฅ๋ํ ๋งคํธ๋ฆญ์ค ๋ฐฑํ๋ ์ธ์ ์ ์์ ์์ ์ฉ์ก๊ณต์ ๋ง์ผ๋ก ์คํ ๊ฐ๋ฅํ๊ฒ ํ๋ค.1 Introduction 1
1.1 Single-Walled Carbon Nanotubes 1
1.2 Band structure of SWCNTs 8
1.2.1 Energy bandgap of SWCNTs 8
1.2.2 Density of states for SWCNTs 11
1.2.3 Detection for classifying species of SWCNTs 13
1.3 Sorting out semiconducting SWCNTs 16
1.3.1 Pre-deposition of the nanotubes and sorting later 16
1.3.2 First sorting out SWCNTs and deposition later 18
1.4 Operation of SWCNT-TFTs 21
1.4.1 SWCNT-TFTs as Schottky-barrier FETs 22
1.4.2 Random network of SWCNTs 26
1.5 Reported SWCNT-TFTs and applications 28
1.6 Technical points for microelectronics based on SWCNT-TFTs 32
1.7 Organization 34
2 Tunable threshold voltage in single-walled carbon nanotube thin-film transistors 35
2.1 Introduction 35
2.2 Experimental details 37
2.2.1 Fabrication process for solution-processed SWCNT-TFTs 37
2.2.2 Post-treatments for tunable threshold voltage in solution-processed SWCNT-TFTs and measurement of their electrical properties 38
2.3 Results and discussion 39
2.3.1 Post-chemical encapsulation for tunable threshold voltage 39
2.3.2 Contact resistance analysis by the Y-function method in SWCNT-TFTs employing chemical encapsulation 41
2.3.3 Shift of energy band in SWCNT-TFTs 42
2.3.4 Cycling tests for post-treatments 45
2.3.5 SWCNTs-based p-type only inverter 46
2.4 Conclusion 49
3 All electrohydrodynamic-jet printing system for single-walled carbon nanotube thin-film transistors 50
3.1 Introduction 50
3.2 Experimental details 55
3.2.1 Ink manufacturing for E-jet printed metal, dielectric, and active layers 55
3.2.2 Optimized E-jet printing conditions and fabrication process for all E-jet printed SWCNT-TFTs 57
3.3 Results and discussion 60
3.3.1 Constituting of all E-jet printing system 60
3.3.2 Optimized E-jet printed metal electrode 63
3.3.3 Optimized E-jet printed polymer dielectric 67
3.3.4 E-jet printing of S/D electrodes with short channel length 74
3.3.5 Formation of SWCNT networks in E-jet printing system 76
3.3.6 Overall process for all E-jet printing and electrical characteristics of all E-jet printed SWCNT-TFTs 78
3.4 Conclusion 83
4 All electrohydrodynamic-jet printing system based circuit design for high-resolution and highly integrated applications 85
4.1 Introduction 85
4.2 Experimental details 89
4.2.1 In-situ fabrication of via-hole and diode-connected SWCNTs-TFTs in all E-jet printing system 89
4.2.2 Fabrication process of all E-jet printed inverter with vertically stacked SWCNT-TFTs 90
4.2.3 Fabrication process of all E-jet printed active pixel sensor for image sensor with vertical stacking structure 92
4.2.4 Fabrication process of all E-jet printed pixel circuit for active matrix polymer light-emitting diode with vertical stacking structure 95
4.3 Results and discussion 98
4.3.1 In-situ via-hole formation technology based on all E-jet printing system 98
4.3.2 Additional E-jet printing of PVP layer on the SWCNT-TFTs 99
4.3.3 Electrical characteristics for all E-jet printed diode-connected SWCNT-TFTs 101
4.3.4 Electrical characteristics for all E-jet printed inverter with vertically stacked SWCNT-TFTs 103
4.3.5 Structure design for active pixel sensor based on vertically stacked E-jet printed SWCNT-TFTs 107
4.3.6 All E-jet printed pixel circuit for active matrix polymer light-emitting diode with vertical stacking structure 110
4.4 Conclusion 118
5 Conclusion 119
Appendix 121
A.1 Post-treatment with DI-water on SWCNT-TFT 121
A.2 Variation of characteristics of SWCNT-TFTs by post-treatment time with NH4OH 123
A.3 Surface energy variation by a ratio between cross-liking agent and PVP 124
A.4 Analysis for surface roughness parameters 125
A.5 Electrical characteristics of E-jet printed SWCNT-TFTs according to channel structure 128
Bibliography 130
Abstract in Korean 149Docto