Scattering vector (h 2 k 2 l 2 ) Scattering vector (h 1 k 1 l 1 ) α α 2θ 2 t New developments of multireflection grazing incidence diffraction

Abstract. The multireflection grazing incident X-ray diffraction (MGIXD) is used to determine a stress gradient in thin surface layers (about 1-20 µm for metals). In this work two theoretical developments of this method are presented. The first procedure enables determination of c/a parameter in hexagonal polycrystalline materials exhibiting residual stresses. In the second method, the influence of stacking faults on the experimental data is considered. The results of both procedures were verified using X-rays diffraction. Introduction Multireflection grazing incidence X-ray diffraction (MGIXD) is a non-destructive method which allows performing an analysis of the heterogeneous stress field for different volumes below the surface of the sample. The penetration depth of X-ray radiation is well defined and does not change during experiment in a wide 2θ range for a given incidence angle