563,419 research outputs found
X-ray Diffraction Tomographic Imaging and Reconstruction
Material discrimination based on conventional or dual energy X-ray computed tomography (CT) imaging can be ambiguous. X-ray diffraction imaging (XDI) can be used to construct diffraction profiles of objects, providing new molecular signature information that can be used to characterize the presence of specific materials. Combining X-ray CT and diffraction imaging can lead to enhanced detection and identification of explosives in luggage screening. In this work we are investigating techniques for joint reconstruction of CT absorption and X-ray diffraction profile images of objects to achieve improved image quality and enhanced material classification. The initial results have been validated via simulation of X-ray absorption and coherent scattering in 2 dimensions.U. S. Department of Homeland Security (2008-ST-061-ED0001
X-ray diffraction from shock-loaded polycrystals
X-ray diffraction was demonstrated from shock-compressed polycrystalline
metal on nanosecond time scales. Laser ablation was used to induce shock waves
in polycrystalline foils of Be, 25 to 125 microns thick. A second laser pulse
was used to generate a plasma x-ray source by irradiation of a Ti foil. The
x-ray source was collimated to produce a beam of controllable diameter, and the
beam was directed at the Be sample. X-rays were diffracted from the sample, and
detected using films and x-ray streak cameras. The diffraction angle was
observed to change with shock pressure. The diffraction angles were consistent
with the uniaxial (elastic) and isotropic (plastic) compressions expected for
the loading conditions used. Polycrystalline diffraction will be used to
measure the response of the crystal lattice to high shock pressures and through
phase changes
Gas gun shock experiments with single-pulse x-ray phase contrast imaging and diffraction at the Advanced Photon Source
The highly transient nature of shock loading and pronounced microstructure
effects on dynamic materials response call for {\it in situ}, temporally and
spatially resolved, x-ray-based diagnostics. Third-generation synchrotron x-ray
sources are advantageous for x-ray phase contrast imaging (PCI) and diffraction
under dynamic loading, due to their high photon energy, high photon fluxes,
high coherency, and high pulse repetition rates. The feasibility of bulk-scale
gas gun shock experiments with dynamic x-ray PCI and diffraction measurements
was investigated at the beamline 32ID-B of the Advanced Photon Source. The
x-ray beam characteristics, experimental setup, x-ray diagnostics, and static
and dynamic test results are described. We demonstrate ultrafast, multiframe,
single-pulse PCI measurements with unprecedented temporal (100 ps) and
spatial (2 m) resolutions for bulk-scale shock experiments, as well
as single-pulse dynamic Laue diffraction. The results not only substantiate the
potential of synchrotron-based experiments for addressing a variety of shock
physics problems, but also allow us to identify the technical challenges
related to image detection, x-ray source, and dynamic loading
Impact of ultrafast electronic damage in single particle x-ray imaging experiments
In single particle coherent x-ray diffraction imaging experiments, performed
at x-ray free-electron lasers (XFELs), samples are exposed to intense x-ray
pulses to obtain single-shot diffraction patterns. The high intensity induces
electronic dynamics on the femtosecond time scale in the system, which can
reduce the contrast of the obtained diffraction patterns and adds an isotropic
background. We quantify the degradation of the diffraction pattern from
ultrafast electronic damage by performing simulations on a biological sample
exposed to x-ray pulses with different parameters. We find that the contrast is
substantially reduced and the background is considerably strong only if almost
all electrons are removed from their parent atoms. This happens at fluences of
at least one order of magnitude larger than provided at currently available
XFEL sources.Comment: 15 pages, 3 figures submitted to PR
X-Ray sum frequency generation; direct imaging of ultrafast electron dynamics
X-ray diffraction from molecules in the ground state produces an image of
their charge density, and time-resolved X-ray diffraction can thus monitor the
motion of the nuclei. However, the density change of excited valence electrons
upon optical excitation can barely be monitored with regular diffraction
techniques due to the overwhelming background contribution of the core
electrons. We present a nonlinear X-ray technique made possible by novel free
electron laser sources, which provides a spatial electron density image of
valence electron excitations. The technique, sum frequency generation carried
out with a visible pump and a broadband X-ray diffraction pulse, yields
snapshots of the transition charge densities, which represent the electron
density variations upon optical excitation. The technique is illustrated by ab
initio simulations of transition charge density imaging for the optically
induced electronic dynamics in a donor/acceptor substituted stilbene
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