34,598 research outputs found

    Long-term on-chip verification of systems with logical events scattered in time

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    Traditional on-chip and off-chip logic analyzers present important shortcomings when used for the longterm verification of industrial embedded systems, forcing the designer to implement ad hoc verification solutions. This paper introduces a suitable solution for long-term verification of FPGA-based designs consisting of a verification core that uses the PicoBlaze microcontroller, dedicated logic and a serial port communication in order to monitor the internal signals of the system in a continuous way. The core design focuses on low resource requirements and has been successfully applied to the verification of a real industrial synchronization platform showing remarkable advantages over commercial on-chip solutions like Xilinx’s ChipScope Pro. Moreover, in order to improve the reusability of this core a software tool has been developed to automatically include the verification core in any specific system.Ministerio de Educación y Ciencia TEC2007-61802/MI

    Design and implementation of a suitable core for on-chip long-term verification

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    Traditional on-chip and off-chip logic analyzers present important shortcomings when used for the long-term verification of industrial embedded systems, forcing the designer to implement ad-hoc verification solutions. This contribution presents a suitable solution for long-term verification of FPGAbased designs consisting on a verification core that uses the Picoblaze microcontroller, dedicated logic and a serial port communication in order to monitor the internal signals of the system in a continuous way. The core design focuses on low resource requirements and reusability and has been successfully applied to the verification of a real industrial synchronization platform showing remarkable advantages over commercial onchip solutions like Xilinx’s ChipScope Pro.Ministerio de Educación y Cultura TEC2007-61802/MIC (HIPERMinisterio de Educación y Cultura PROFIT-MITC SEPIC TSI-020100-2008-25

    Achieving Functional Correctness in Large Interconnect Systems.

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    In today's semi-conductor industry, large chip-multiprocessors and systems-on-chip are being developed, integrating a large number of components on a single chip. The sheer size of these designs and the intricacy of the communication patterns they exhibit have propelled the development of network-on-chip (NoC) interconnects as the basis for the communication infrastructure in these systems. Faced with the interconnect's growing size and complexity, several challenges hinder its effective validation. During the interconnect's development, the functional verification process relies heavily on the use of emulation and post-silicon validation platforms. However, detecting and debugging errors on these platforms is a difficult endeavour due to the limited observability, and in turn the low verification capabilities, they provide. Additionally, with the inherent incompleteness of design-time validation efforts, the potential of design bugs escaping into the interconnect of a released product is also a concern, as these bugs can threaten the viability of the entire system. This dissertation provides solutions to enable the development of functionally correct interconnect designs. We first address the challenges encountered during design-time verification efforts, by providing two complementary mechanisms that allow emulation and post-silicon verification frameworks to capture a detailed overview of the functional behaviour of the interconnect. Our first solution re-purposes the contents of in-flight traffic to log debug data from the interconnect's execution. This approach enables the validation of the interconnect using synthetic traffic workloads, while attaining over 80% observability of the routes followed by packets and capturing valuable debugging information. We also develop an alternative mechanism that boosts observability by taking periodic snapshots of execution, thus extending the verification capabilities to run both synthetic traffic and real-application workloads. The collected snapshots enhance detection and debugging support, and they provide observability of over 50% of packets and reconstructs at least half of each of their routes. Moreover, we also develop error detection and recovery solutions to address the threat of design bugs escaping into the interconnect's runtime operation. Our runtime techniques can overcome communication errors without needing to store replicate copies of all in-flight packets, thereby achieving correctness at minimal area costsPhDComputer Science and EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/116741/1/rawanak_1.pd

    A framework for system level verification : the SystemC Case

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    Recent advances in hardware design has enabled integration of a complete yet complex systems on a single chip (called System-on-a-Chip: SoC). It is conceivable that the role of traditional Register Transfer level (RTL) languages will diminish to an extent akin to assembly level languages in software design. Therefore, new design languages or so-called System Level Languages (SLL) have emerged. Verification techniques for SOC designs also need to change with this trend. Combining classical verification techniques, such as simulation, with several other formal techniques, into a single approach has been gaining attention in SoC verification. Classical simulation based verification techniques when used with SystemC face several problems related to the object-oriented aspect of SystemClibrary and due to the complexity of its simulation environment. In this talk, we present our proposed methodology to verify SoC designs modeled in SystemC. To this end, we introduce a hybrid approach combining static code analysis, model checking and assertion based verification. We also propose to augment the approach by a test generation module in order to improve the coverage metrics in comparison to the classical simulation approach (mainly based on random test generation
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