Training-Free Synthesized Face Sketch Recognition Using Image Quality Assessment Metrics

Face sketch synthesis has wide applications ranging from digital entertainments to law enforcements. Objective image quality assessment scores and face recognition accuracy are two mainly used tools to evaluate the synthesis performance. In this paper, we proposed a synthesized face sketch recognition framework based on full-reference image quality assessment metrics. Synthesized sketches generated from four state-of-the-art methods are utilized to test the performance of the proposed recognition framework. For the image quality assessment metrics, we employed the classical structured similarity index metric and other three prevalent metrics: visual information fidelity, feature similarity index metric and gradient magnitude similarity deviation. Extensive experiments compared with baseline methods illustrate the effectiveness of the proposed synthesized face sketch recognition framework. Data and implementation code in this paper are available online at www.ihitworld.com/WNN/IQA_Sketch.zip

Deep Embedding using Bayesian Risk Minimization with Application to Sketch Recognition

In this paper, we address the problem of hand-drawn sketch recognition. Inspired by the Bayesian decision theory, we present a deep metric learning loss with the objective to minimize the Bayesian risk of misclassification. We estimate this risk for every mini-batch during training, and learn robust deep embeddings by backpropagating it to a deep neural network in an end-to-end trainable paradigm. Our learnt embeddings are discriminative and robust despite of intra-class variations and inter-class similarities naturally present in hand-drawn sketch images. Outperforming the state of the art on sketch recognition, our method achieves 82.2% and 88.7% on TU-Berlin-250 and TU-Berlin-160 benchmarks respectively.Comment: Accepted at ACCV 201