Test Pattern Generation Algorithm Using Structurally Synthesized BDD

Structurally Synthesized Binary DecisionDiagrams (SSBDDs) have an important characteristicproperty of keeping information about circuit’s structure.Boolean difference of a circuit is used to find test pattern forstuck at fault in combinational circuit but the algebraicmanipulation involved in solving Boolean difference is atedious job. In this paper an efficient algorithm is proposed tocompute Boolean difference and test patterns simply usingsearching the paths of SSBDD. This model reduces algebraicmanipulations and takes less time to compute the test pattern