Testing devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients

This paper describes a new approach for fast and accurate determination of the source reflection coefficient in microwave source-pull measurements. To the authors' knowledge, this is the only technique that allows the simultaneous measurement of the source and the DUT gammas. A traditional vector network analyzer is used as a three-channel receiver. The calibration procedure is based on a new reflectometer model that extends the traditional error box concept. Experimental results are presented and compared to data obtained with traditional techniques

Simple Technique for source reflection coefficient measurement while characterizing active devices

This paper describes a simple, yet rigorous technique for fast and accurate determination of the source reflection coefficient during the characterization of microwave active devices. The solution consists in measuring the waves at the DUT reference plane under two different bias conditions. Since the DUT small signal impedance value depends on the bias voltage, the waves at the DUT input port changes as well. We proved that their measurements give enough information to compute the source reflection coefficient with accuracy suitable for most applications. The correction for systematic errors is based in the traditional error-box model and it does not require any exotic calibration procedures. Experimental results are presented and compared to data obtained with more traditional technique

Advanced High Efficiency and Broadband Power Amplifiers Based on GaN HEMT for Wireless Applications

In advanced wireless communication systems, a rapid increase in the mobile data traffic and broad information bandwidth requirement can lead to the use of complex spectrally efficient modulation schemes such as orthogonal frequency-division multiplexing (OFDM). Generally, complex non-constant envelope modulated signals have very high peak-to-average ratios (PAPR). Doherty Power Amplifier (DPA) is the most commonly used power amplifier (PA) architecture for meeting high efficiency requirement in advanced communication systems, in the presence of high PAPR signals. However, limited bandwidth of the conventional DPA is often identified as a bottleneck for widespread deployment in base-station application for multi-standard communication signals. The research in this thesis focuses on the development of new designs to overcome the bandwidth limitations of a conventional PA. In particular, the bandwidth limitation factors of a conventional DPA architecture are studied. Moreover, a novel design technique is proposed for DPA’s bandwidth extension. In the first PA design, limited bandwidth and linearity problems are addressed simultaneously. For this purpose, a new Class-AB PA with extended bandwidth and improved linearity is presented for LTE 5 W pico-cell base-station over a frequency range of 1.9–2.5 GHz. A two-tone load/source-pull and bias point optimization techniques are used to extract the sweet spots for optimum efficiency and linearity from the 6 W Cree GaN HEMT device for the whole frequency band. The realized prototype presented saturated PAE higher than 60%, a power gain of 13 dB and an average output power of 36.5 dBm over the desired bandwidth. The proposed PA is also characterized by QAM-256 and LTE input communication signals for linearity characterization. Measured ACPRs are lower than -40 dBc for an input power of 17 dBm. The documented results indicate that the proposed Class-AB architecture is suitable for pico-cell base-station application. In the second PA design, an inherent bandwidth limitation of Class-F power amplifier forced by the improper load harmonics terminations at multiple harmonics is investigated and analyzed. It is demonstrated that the impedance tuning of the second and third harmonics at the drain terminal of a transistor is crucial to achieve a broadband performance. The effect of harmonics terminations on power amplifier’s bandwidth up to fourth harmonics is investigated. The implemented broadband Class-F PA achieved maximum saturated drain efficiency 60-77%, and 10 W output power throughout (1.1-2.1 GHz) band. The simulated and measured results verify that the presented Class-F PA is suitable for a high-efficiency system application in wireless communications over a wide range of frequencies. In the third PA design, a single- and dual-input DPA for LTE application in the 3.5 GHz frequency band are presented and compared. The main goal of this study is to improve the performance of gallium–nitride (GaN) Doherty transmitters over a wide bandwidth in the 3.5 GHz frequency band. For this purpose, the linearity-efficiency trade-off for the two proposed architectures is discussed in detail. Simulated results demonstrate that the single- and dual-input DPA exhibited a peak drain efficiency (DE) of 72.4% and 77%, respectively. Both the circuits showed saturated output power more than 42.9 dBm throughout the designed band. Saturated efficiency, gain and bandwidth of dual-input DPA are higher than that of the single-input DPA. On the other side, dual-input DPA linearity is worse as compared to the single-input DPA. In the last PA design, a novel design methodology for ultra-wide band DPA is presented. The bandwidth limitation factors of the conventional Doherty amplifier are discussed on the ground of broadband matching with impedance variation. To extend the DPA bandwidth, three different methods are used such as post-matching, low impedance transformation ratio and the optimization of offset line for wide bandwidth in the proposed design. The proposed Doherty power amplifier was designed and realized based on two 10 W GaN HEMT devices from Cree Inc. The measured results exhibited 42-57% of efficiency at the 6-dB back-off and saturated output power ranges from 41.5 to 43.1 dBm in the frequency range of 1.15 to 2.35 GHz (68.5% fractional bandwidth). Moreover, less than -25 dBc ACPRs are measured at 42 dBm peak output power throughout the designed band. In a nutshell, all power amplifiers presented in this thesis are suitable for wideband operation and their performances are satisfying the required operational standard. Therefore, this thesis has a significant contribution in the domain of high efficiency and broadband power amplifiers

Nonlinear mechanisms in passive microwave devices

Premi extraordinari doctorat curs 2010-2011, àmbit d’Enginyeria de les TICThe telecommunications industry follows a tendency towards smaller devices, higher power and higher frequency, which imply an increase on the complexity of the electronics involved. Moreover, there is a need for extended capabilities like frequency tunable devices, ultra-low losses or high power handling, which make use of advanced materials for these purposes. In addition, increasingly demanding communication standards and regulations push the limits of the acceptable performance degrading indicators. This is the case of nonlinearities, whose effects, like increased Adjacent Channel Power Ratio (ACPR), harmonics, or intermodulation distortion among others, are being included in the performance requirements, as maximum tolerable levels. In this context, proper modeling of the devices at the design stage is of crucial importance in predicting not only the device performance but also the global system indicators and to make sure that the requirements are fulfilled. In accordance with that, this work proposes the necessary steps for circuit models implementation of different passive microwave devices, from the linear and nonlinear measurements to the simulations to validate them. Bulk acoustic wave resonators and transmission lines made of high temperature superconductors, ferroelectrics or regular metals and dielectrics are the subject of this work. Both phenomenological and physical approaches are considered and circuit models are proposed and compared with measurements. The nonlinear observables, being harmonics, intermodulation distortion, and saturation or detuning, are properly related to the material properties that originate them. The obtained models can be used in circuit simulators to predict the performance of these microwave devices under complex modulated signals, or even be used to predict their performance when integrated into more complex systems. A key step to achieve this goal is an accurate characterization of materials and devices, which is faced by making use of advanced measurement techniques. Therefore, considerations on special measurement setups are being made along this thesis.Award-winningPostprint (published version

Concepts for Short Range Millimeter-wave Miniaturized Radar Systems with Built-in Self-Test

This work explores short-range millimeter wave radar systems, with emphasis on miniaturization and overall system cost reduction. The designing and implementation processes, starting from the system level design considerations and characterization of the individual components to final implementation of the proposed architecture are described briefly. Several D-band radar systems are developed and their functionality and performances are demonstrated

INVESTIGATION OF RELIABILITY IN GALLIUM NITRIDE HIGH ELECTRON MOBILITY TRANSISTORS USING EQUIVALENT CIRCUIT MODELS FOR USE IN HIGH POWER, HIGH FREQUENCY MICROWAVE AMPLIFIERS

Gallium Nitride (GaN) is beginning to emerge as an alternative to the Gallium Arsenide in high power, high frequency microwave communications. Other novel semiconductors show potential at higher frequency applications. The largest obstacles to GaN emerging as the dominant microwave semiconductor are the issue of cost, which could be reduced through volume, and question of reliability. A new approach to the analysis of reliability has been developed based on the periodic generation of equivalent circuit models while a device is stressed in a manner that is similar to performance likely to be seen during commercial operation. Care was made in this research to ensure that the stress measurements used to induce degradation are as close as possible to those that would degrade a device in real world applications. Equivalent circuit models (ECM) can be used to simulate a device in computer aided design (CAD) software, but these models also provide a picture of the physical properties within the device at a specific point in time. The periodic generation of ECMs allows the researcher to understand the physical changes in the device over time by performing non-destructive electronic measurements. By analyzing the changes in device performance, the physical mechanism of device degradation can be determined. A system was developed to induce degradation and perform measurements of sufficient detail to produce a large signal ECM. Software for producing the ECM was also created. The changes in the ECM were analyzed to diagnose the physical changes in the device under test (DUT) and to identify a method of degradation. The information acquired from this system can be used to improve the device manufacturing process at the foundry. It can also be used to incorporate device degradation into the operation of systems

Spectral characterisation of devices: at high frequencies and measurement methods

The properties of nonlinear devices, semiconductor diodes, were determined at high frequencies using the method of spectral characterisation. Such characterisation was carried out employing a specially developed technique where the components of the harmonic spectrum generated within these diodes at radio and microwave frequencies were measured. The theory of spectral analysis, based on Fourier principles, was reviewed. It was applied to the periodic gate function, which plays a fundamental role in signal analysis, in order to lay the foundation for the theoretical investigation carried out between pulses of known shapes and their corresponding spectra. Some useful relationships were established and applied in the evaluation of devices. Based on the fundamental properties of the periodic gate function, two new sampling procedures were introduced. The harmonic generating properties of practical diodes, where the nonlinearity in the element is an inherent condition, were examined. It was established that the spectrum generated within the device, at a particular drive level, gives the "fingerprint" of the diode, i.e. represents fully its nonlinearity. Measurement methods, both at low and high frequencies, were also discussed. The new technique, called the Multiple Reflections Resonant Line (MRRL) method was developed and described in the thesis to measure a complete spectrum. The method employed a coaxial slotted line system terminated by the device under test. The basic transmission line theory was extended to include the phenomena of multiple reflections along and resonance of, the line. The properties of the standing waves were then related to the device parameters. The twelve microwave diodes were successfully modelled which included parasitics using the new spectral technique. An attempt was made to evaluate these devices for particular applications