INTERNATIONAL STANDARD SERIAL NUMBERS (Translation and Original): 0926-5473Specific test problems have to be solved in the case of circuits with fault tolerance capabilities. This paper addresses the off-line test of single fault tolerant controllers embedded in VLSI circuits. After a brief presentation of the controller architectures, an approach is proposed to solve the test problems using simple built-in devices. A failure mode analysis demonstrates that this approach is efficient and appropriate to the application field