CORE

🇺🇦   make metadata, not war

    2 research outputs found

    Test Generation for Delay Faults on Clock Lines under Launch-on-Capture Test Environment

    Author
      Publication venue
      'Institute of Electronics, Information and Communications Engineers (IEICE)'
      Publication date
      Field of study
      No full text
      Crossref

      Thermal Issues in Testing of Advanced Systems on Chip

      Author
        Publication venue
        'Linkoping University Electronic Press'
        Publication date
        Field of study
        Full text link
        Crossref
        corecore