Structured illumination microscopy with unknown patterns and a statistical prior

Structured illumination microscopy (SIM) improves resolution by down-modulating high-frequency information of an object to fit within the passband of the optical system. Generally, the reconstruction process requires prior knowledge of the illumination patterns, which implies a well-calibrated and aberration-free system. Here, we propose a new \textit{algorithmic self-calibration} strategy for SIM that does not need to know the exact patterns {\it a priori}, but only their covariance. The algorithm, termed PE-SIMS, includes a Pattern-Estimation (PE) step requiring the uniformity of the sum of the illumination patterns and a SIM reconstruction procedure using a Statistical prior (SIMS). Additionally, we perform a pixel reassignment process (SIMS-PR) to enhance the reconstruction quality. We achieve 2$\times$ better resolution than a conventional widefield microscope, while remaining insensitive to aberration-induced pattern distortion and robust against parameter tuning

2D and 3D structured illumination microscopy with unknown patterns and a statistical prior

Structured illumination microscopy (SIM) is one of the most widely applied super-resolution microscopy techniques in bioimaging. It improves resolution by down-modulating a sample’s high spatial frequency information to fit within the passband of the optical system. Normally, the reconstruction process requires prior knowledge of the illumination patterns. Aberrations from the optical system or from the sample itself will distort the patterns and degrade performance. Here, we propose a new algorithmic self-calibration strategy for both 2D and 3D SIM that does not need to know the exact patterns a priori, but only their covariance. The algorithm, termed PE-SIMS, includes a pattern-estimation (PE) step requiring the uniformity of the sum of the illumination patterns and a SIM reconstruction procedure using a statistical prior (SIMS). We achieve 2x better resolution than a conventional widefield microscope, without needing to know the illumination patterns and while remaining insensitive to aberration-induced pattern distortion. Please click Additional Files below to see the full abstract

Untrained, physics-informed neural networks for structured illumination microscopy

In recent years there has been great interest in using deep neural networks (DNN) for super-resolution image reconstruction including for structured illumination microscopy (SIM). While these methods have shown very promising results, they all rely on data-driven, supervised training strategies that need a large number of ground truth images, which is experimentally difficult to realize. For SIM imaging, there exists a need for a flexible, general, and open-source reconstruction method that can be readily adapted to different forms of structured illumination. We demonstrate that we can combine a deep neural network with the forward model of the structured illumination process to reconstruct sub-diffraction images without training data. The resulting physics-informed neural network (PINN) can be optimized on a single set of diffraction limited sub-images and thus doesn't require any training set. We show with simulated and experimental data that this PINN can be applied to a wide variety of SIM methods by simply changing the known illumination patterns used in the loss function and can achieve resolution improvements that match well with theoretical expectations.Comment: Preprint for journal submission. 21 Pages. 5 main text figures. 6 supplementary figure

Direct 3D Tomographic Reconstruction and Phase-Retrieval of Far-Field Coherent Diffraction Patterns

We present an alternative numerical reconstruction algorithm for direct tomographic reconstruction of a sample refractive indices from the measured intensities of its far-field coherent diffraction patterns. We formulate the well-known phase-retrieval problem in ptychography in a tomographic framework which allows for simultaneous reconstruction of the illumination function and the sample refractive indices in three dimensions. Our iterative reconstruction algorithm is based on the Levenberg-Marquardt algorithm. We demonstrate the performance of our proposed method with simulation studies

Machine learning -- based diffractive imaging with subwavelength resolution

Far-field characterization of small objects is severely constrained by the diffraction limit. Existing tools achieving sub-diffraction resolution often utilize point-by-point image reconstruction via scanning or labelling. Here, we present a new imaging technique capable of fast and accurate characterization of two-dimensional structures with at least wavelength/25 resolution, based on a single far-field intensity measurement. Experimentally, we realized this technique resolving the smallest-available to us 180-nm-scale features with 532-nm laser light. A comprehensive analysis of machine learning algorithms was performed to gain insight into the learning process and to understand the flow of subwavelength information through the system. Image parameterization, suitable for diffractive configurations and highly tolerant to random noise was developed. The proposed technique can be applied to new characterization tools with high spatial resolution, fast data acquisition, and artificial intelligence, such as high-speed nanoscale metrology and quality control, and can be further developed to high-resolution spectroscop