20,446 research outputs found
Behavioral Models of I/O Ports from Measured Transient Waveforms
This paper addresses the development of accurate and efficient behavioral models of digital integrated circuit ports from measured transient responses. The proposed approach is based on the estimation of parametric models from port voltage and current waveforms. The modeling process is described and applied to the modeling of output ports. Its feasibility is demonstrated by the identification of a real device from actual measurements, and by the comparison of the predicted device response with the measured one
M[pi]log, Macromodeling via parametric identification of logic gates
This paper addresses the development of computational models of digital integrated circuit input and output buffers via the identification of nonlinear parametric models. The obtained models run in standard circuit simulation environments, offer improved accuracy and good numerical efficiency, and do not disclose information on the structure of the modeled devices. The paper reviews the basics of the parametric identification approach and illustrates its most recent extensions to handle temperature and supply voltage variations as well as power supply ports and tristate devices
Optimizing CMOS circuits for low power using transistor reordering
This paper addresses the optimization of a circuit for low power using transistor reordering. The optimization algorithm relies on a stochastic model of a static CMOS gate that includes the power internal nodes of the gate. This power consumption depends on the switching activity and the equilibrium probabilities of the inputs of the gate. The model allows an exploration of the different configurations of a gate that are obtained by recording its transistors. Thus, the best configuration of each gate is selected and the overall power consumption of the circuit is reduced.Peer ReviewedPostprint (published version
An Electromigration and Thermal Model of Power Wires for a Priori High-Level Reliability Prediction
In this paper, a simple power-distribution electrothermal model including the interconnect self-heating is used together with a statistical model of average and rms currents of functional blocks and a high-level model of fanout distribution and interconnect wirelength. Following the 2001 SIA roadmap projections, we are able to predict a priori that the minimum width that satisfies the electromigration constraints does not scale like the minimum metal pitch in future technology nodes. As a consequence, the percentage of chip area covered by power lines is expected to increase at the expense of wiring resources unless proper countermeasures are taken. Some possible solutions are proposed in the paper
Parametric Macromodels of Digital I/O Ports
This paper addresses the development of macromodels for input and output ports of a digital device. The proposed macromodels consist of parametric representations that can be obtained from port transient waveforms at the device ports via a well established procedure. The models are implementable as SPICE subcircuits and their accuracy and efficiency are verified by applying the approach to the characterization of transistor-level models of commercial devices
Ring oscillator clocks and margins
How much margin do we have to add to the delay lines of a bundled-data circuit? This paper is an attempt to give a methodical answer to this question, taking into account all sources of variability and the existing EDA machinery for timing analysis and sign-off. The paper is based on the study of the margins of a ring oscillator that substitutes a PLL as clock generator. A timing model is proposed that shows that a 12% margin for delay lines can be sufficient to cover variability in a 65nm technology. In a typical scenario, performance and energy improvements between 15% and 35% can be obtained by using a ring oscillator instead of a PLL. The paper concludes that a synchronous circuit with a ring oscillator clock shows similar benefits in performance and energy as those of bundled-data asynchronous circuits.Peer ReviewedPostprint (author's final draft
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