Static Voltage Over-scaling and Dynamic Voltage Variation Tolerance with Replica Circuits and Time Redundancy in Reconfigurable Devices

Abstract—This paper studies performance and timing failure probability of time-shifted redundant circuits and replica circuits. Measurement-based experiments using a fabricated test chip are performed. For an approximately similar false positive error probability for time-shifted redundant circuits and replica circuits, the false negative error probability of time-shifted redundant circuits is approximately two orders of magnitude less than that of the replica circuits. When attaining a false negative error of zero, time-shifted redundant circuits achieves one order of magnitude less in false positive error probability than that of the replica circuits. Keywords-Dynamic voltage variations; voltage scaling; replica circuits; time diversity; timing errors; error prediction; error detection; variation tolerant circuits I