2 research outputs found
Towards Multidimensional Verification: Where Functional Meets Non-Functional
Trends in advanced electronic systems' design have a notable impact on design
verification technologies. The recent paradigms of Internet-of-Things (IoT) and
Cyber-Physical Systems (CPS) assume devices immersed in physical environments,
significantly constrained in resources and expected to provide levels of
security, privacy, reliability, performance and low power features. In recent
years, numerous extra-functional aspects of electronic systems were brought to
the front and imply verification of hardware design models in multidimensional
space along with the functional concerns of the target system. However,
different from the software domain such a holistic approach remains
underdeveloped. The contributions of this paper are a taxonomy for
multidimensional hardware verification aspects, a state-of-the-art survey of
related research works and trends towards the multidimensional verification
concept. The concept is motivated by an example for the functional and power
verification dimensions.Comment: 2018 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP
and International Symposium of System-on-Chip (SoC
A Novel Sequence Generation Approach to Diagnose Faults in Reconfigurable Scan Networks
With the complexity of nanoelectronic devices rapidly increasing, an efficient way to handle large number of embedded instruments became a necessity. The IEEE 1687 standard was introduced to provide flexibility in accessing and controlling such instrumentation through a reconfigurable scan chain. Nowadays, together with testing the system for defects that may affect the scan chains themselves, the diagnosis of such faults is also important. This article proposes a method for generating stimuli to precisely identify permanent high-level faults in a IEEE 1687 reconfigurable scan chain: the system is modeled as a finite state automaton where faults correspond to multiple incorrect transitions; then, a dynamic greedy algorithm is used to select a sequence of inputs able to distinguish between all possible faults. Experimental results on the widely-adopted ITC'02 and ITC'16 benchmark suites, as well as on synthetically generated circuits, clearly demonstrate the applicability and effectiveness of the proposed approach: generated sequences are two orders of magnitude shorter compared to previous methodologies, while the computational resources required remain acceptable even for larger benchmarks